Choon-Shik LEEM

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for measuring semiconductor device
- Patent number 10,281,412
- Issue date May 7, 2019
- Samsung Electronics Co., Ltd.
- Choon-Shik Leem
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting wafer
- Patent number 9,939,388
- Issue date Apr 10, 2018
- Samsung Electronics Co., Ltd.
- Choon-Shik Leem
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for monitoring semiconductor fabrication processes using po...
- Patent number 9,551,653
- Issue date Jan 24, 2017
- Samsung Electronics Co., Ltd.
- Woong-Kyu Son
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and method for monitoring semiconductor fabrication proce...
- Patent number 9,322,771
- Issue date Apr 26, 2016
- Samsung Electronics Co., Ltd.
- Woong-Kyu Son
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS FOR INSPECTING WAFER
- Publication number 20170115233
- Publication date Apr 27, 2017
- Samsung Electronics Co., Ltd.
- Choon-Shik LEEM
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEASURING SEMICONDUCTOR DEVICE
- Publication number 20170102343
- Publication date Apr 13, 2017
- Samsung Electronics Co., Ltd.
- Choon-Shik Leem
- G01 - MEASURING TESTING
Information Patent Application
Methods for Monitoring Semiconductor Fabrication Processes Using Po...
- Publication number 20160204043
- Publication date Jul 14, 2016
- Woong-Kyu Son
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUSES FOR MEASURING VALUES OF PARAMETERS OF INTEG...
- Publication number 20150219446
- Publication date Aug 6, 2015
- Samsung Electronics Co., Ltd.
- Choon-Shik LEEM
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MONITORING SEMICONDUCTOR FABRICATION PROCESS USING XPS
- Publication number 20140342477
- Publication date Nov 20, 2014
- Samsung Electronics Co., Ltd.
- Choon-Shik LEEM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and Method for Monitoring Semiconductor Fabrication Proce...
- Publication number 20140264052
- Publication date Sep 18, 2014
- Samsung Electronics Co., Ltd.
- Woong-Kyu SON
- G01 - MEASURING TESTING