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Chris BONINO
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Boulder, CO, US
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last 30 patents
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Patent Grant
Advanced systems and methods for interferometric particle detection...
Patent number
11,988,593
Issue date
May 21, 2024
Particle Measuring Systems, Inc.
Timothy A Ellis
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
ADVANCED SYSTEMS AND METHODS FOR INTERFEROMETRIC PARTICLE DETECTION...
Publication number
20240230509
Publication date
Jul 11, 2024
Particle Measuring Systems, Inc.
Timothy A. ELLIS
G01 - MEASURING TESTING
Information
Patent Application
ADVANCED SYSTEMS AND METHODS FOR INTERFEROMETRIC PARTICLE DETECTION...
Publication number
20240133793
Publication date
Apr 25, 2024
Particle Measuring Systems, Inc.
Timothy A. ELLIS
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE DETECTION VIA SCATTERED LIGHT COMBINED WITH INCIDENT LIGHT
Publication number
20210381948
Publication date
Dec 9, 2021
Particle Measuring Systems, Inc.
Daniel RODIER
G01 - MEASURING TESTING
Information
Patent Application
ADVANCED SYSTEMS AND METHODS FOR INTERFEROMETRIC PARTICLE DETECTION...
Publication number
20210208054
Publication date
Jul 8, 2021
Particle Measuring Systems, Inc.
Timothy A. ELLIS
G01 - MEASURING TESTING