Chris D. Atkinson

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Lewisville, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
By-die-exposure for patterning of holes in edge die
- Patent number 8,273,523
- Issue date Sep 25, 2012
- Texas Instruments Incorporated
- Shangting Detweiler
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for cassette integrity testing using a wafer s...
- Patent number 7,596,456
- Issue date Sep 29, 2009
- Texas Instruments Incorporated
- Kelly C. Mollenkopf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for exposure of partial edge die
- Patent number 7,374,866
- Issue date May 20, 2008
- Texas Instruments Incorporated
- Chris D. Atkinson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Error reduction in semiconductor processes
- Patent number 6,848,066
- Issue date Jan 25, 2005
- Texas Instruments Incorporated
- Chris D. Atkinson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Error reduction in semiconductor processes
- Patent number 6,645,684
- Issue date Nov 11, 2003
- Texas Instruments Incorporated
- Chris D. Atkinson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
BY-DIE-EXPOSURE FOR PATTERNING OF HOLES IN EDGE DIE
- Publication number 20080160779
- Publication date Jul 3, 2008
- Shangting Detweiler
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System and method for analyzing a light beam of a wafer inspection...
- Publication number 20080056557
- Publication date Mar 6, 2008
- TEXAS INSTRUMENTS INCORPORATED
- J.E. Patrick Gagnon
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for cassette integrity testing using a wafer s...
- Publication number 20070118300
- Publication date May 24, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Kelly C. Mollenkopf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for exposure of partial edge die
- Publication number 20060078828
- Publication date Apr 13, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Chris D. Atkinson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Error reduction in semiconductor processes
- Publication number 20040029029
- Publication date Feb 12, 2004
- Chris D. Atkinson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Error reduction in semiconductor processes
- Publication number 20030068833
- Publication date Apr 10, 2003
- Chris D. Atkinson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY