Chris Guo Lee

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for auto-learning tool matching
- Patent number 10,429,320
- Issue date Oct 1, 2019
- KLA-Tencor Corporation
- Francis Raquel
- G01 - MEASURING TESTING
Information Patent Grant
Selecting one or more parameters for inspection of a wafer
- Patent number 9,601,393
- Issue date Mar 21, 2017
- KLA-Tencor Corp.
- Chris Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selecting parameters for defect detection methods
- Patent number 9,310,316
- Issue date Apr 12, 2016
- KLA-Tencor Corp.
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Grant
Computer-implemented methods for performing one or more defect-rela...
- Patent number 9,037,280
- Issue date May 19, 2015
- KLA-Tencor Technologies Corp.
- Mark Dishner
- G05 - CONTROLLING REGULATING
Information Patent Grant
Unbiased wafer defect samples
- Patent number 8,948,494
- Issue date Feb 3, 2015
- KLA-Tencor Corp.
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Email proxy server with first respondent binding
- Patent number 8,458,264
- Issue date Jun 4, 2013
- Chris Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
In-place management of semiconductor equipment recipes
- Patent number 8,392,136
- Issue date Mar 5, 2013
- KLA-Tencor Corporation
- Chris W. Lee
- G01 - MEASURING TESTING
Information Patent Grant
Process excursion detection
- Patent number 8,289,510
- Issue date Oct 16, 2012
- KLA-Tencor Corporation
- Patrick Y. Huet
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic discovery and database password expiration management
- Patent number 7,814,558
- Issue date Oct 12, 2010
- International Business Machines Corporation
- Yen-Fu Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process excursion detection
- Patent number 7,646,476
- Issue date Jan 12, 2010
- KLA-Tencor Corporation
- Patrick Y. Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process excursion detection
- Patent number 7,394,534
- Issue date Jul 1, 2008
- KLA-Tencor Corporation
- Patrick Y. Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for determining relative relevance between por...
- Patent number 7,254,587
- Issue date Aug 7, 2007
- International Business Machines Corporation
- Chris Guo Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data processing system
- Patent number 7,113,947
- Issue date Sep 26, 2006
- International Business Machines Corporation
- Donald Edward Benson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data processing system
- Patent number 6,871,203
- Issue date Mar 22, 2005
- International Business Machines Corporation
- Donald Edward Benson
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
REASONING AND INFERRING REAL-TIME CONDITIONS ACROSS A SYSTEM OF SYS...
- Publication number 20230067434
- Publication date Mar 2, 2023
- Falkonry Inc.
- Suhas MEHTA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTELLIGENT SCHEDULING VIA A SECONDARY CALENDAR
- Publication number 20220147950
- Publication date May 12, 2022
- Kronologic, Inc.
- Christopher Sean Anthony Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTELLIGENT SCHEDULING
- Publication number 20200372436
- Publication date Nov 26, 2020
- Kronologic, Inc.
- Christopher Sean Anthony Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Auto-Learning Tool Matching
- Publication number 20140358480
- Publication date Dec 4, 2014
- KLA-Tencor Corporation
- Francis Raquel
- G01 - MEASURING TESTING
Information Patent Application
Unbiased Wafer Defect Samples
- Publication number 20140133737
- Publication date May 15, 2014
- KLA-Tencor Corporation
- Martin Plihal
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Application
Selecting Parameters for Defect Detection Methods
- Publication number 20140072203
- Publication date Mar 13, 2014
- KLA-Tencor Corporation
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Application
IN-PLACE MANAGEMENT OF SEMICONDUCTOR EQUIPMENT RECIPES
- Publication number 20120010843
- Publication date Jan 12, 2012
- KLA-Tencor Corporation
- Chris W. Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Selecting One or More Parameters for Inspection of a Wafer
- Publication number 20110320149
- Publication date Dec 29, 2011
- KLA-Tencor Corporation
- Chris Lee
- G01 - MEASURING TESTING
Information Patent Application
Process Excursion Detection
- Publication number 20110137576
- Publication date Jun 9, 2011
- KLA-Tencor Corporation
- Patrick Y. Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Process Excursion Detection
- Publication number 20100067781
- Publication date Mar 18, 2010
- KLA-Tencor Corporation
- Patrick Y. Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Dynamic Discovery and Database Password Expiration Management
- Publication number 20080313727
- Publication date Dec 18, 2008
- Yen-Fu Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Process Excursion Detection
- Publication number 20080204739
- Publication date Aug 28, 2008
- KLA-Tencor Corporation
- Patrick Y. Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING RELATIVE RELEVANCE BETWEEN POR...
- Publication number 20070234140
- Publication date Oct 4, 2007
- Chris Guo Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for dynamic discovery and database password expir...
- Publication number 20070214500
- Publication date Sep 13, 2007
- International Business Machines Corporation
- Yen-Fu Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Computer-implemented methods for performing one or more defect-rela...
- Publication number 20060287751
- Publication date Dec 21, 2006
- Mark Dishner
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and apparatus for determining relative relevance between por...
- Publication number 20050154761
- Publication date Jul 14, 2005
- International Business Machines Corporation
- Chris Guo Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Data processing system
- Publication number 20030069890
- Publication date Apr 10, 2003
- International Business Machines Corporation
- Donald Edward Benson
- G06 - COMPUTING CALCULATING COUNTING

Chris Guo Lee

Person

Patents Grantslast 30 patents

Method for auto-learning tool matching

Selecting one or more parameters for inspection of a wafer

Selecting parameters for defect detection methods

Computer-implemented methods for performing one or more defect-rela...

Unbiased wafer defect samples

Email proxy server with first respondent binding

In-place management of semiconductor equipment recipes

Process excursion detection

Dynamic discovery and database password expiration management

Process excursion detection

Process excursion detection

Method and apparatus for determining relative relevance between por...

Data processing system

Data processing system

Patents Applicationslast 30 patents

REASONING AND INFERRING REAL-TIME CONDITIONS ACROSS A SYSTEM OF SYS...

INTELLIGENT SCHEDULING VIA A SECONDARY CALENDAR

INTELLIGENT SCHEDULING

Method for Auto-Learning Tool Matching

Unbiased Wafer Defect Samples

Selecting Parameters for Defect Detection Methods

IN-PLACE MANAGEMENT OF SEMICONDUCTOR EQUIPMENT RECIPES

Selecting One or More Parameters for Inspection of a Wafer

Process Excursion Detection

Process Excursion Detection

Dynamic Discovery and Database Password Expiration Management

Process Excursion Detection

METHOD AND APPARATUS FOR DETERMINING RELATIVE RELEVANCE BETWEEN POR...

System and method for dynamic discovery and database password expir...

Computer-implemented methods for performing one or more defect-rela...

Method and apparatus for determining relative relevance between por...

Data processing system