Chris Mack

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Detection of probabilistic process windows
- Patent number 12,142,454
- Issue date Nov 12, 2024
- Fractilla, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generating and analyzing roughness measuremen...
- Patent number 11,996,265
- Issue date May 28, 2024
- Fractilla, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generating and analyzing roughness measurements
- Patent number 11,670,480
- Issue date Jun 6, 2023
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Edge detection system
- Patent number 11,664,188
- Issue date May 30, 2023
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for predicting stochastic-aware process window an...
- Patent number 11,521,825
- Issue date Dec 6, 2022
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for low-noise edge detection and its use for proc...
- Patent number 11,508,546
- Issue date Nov 22, 2022
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generating and analyzing roughness measuremen...
- Patent number 11,380,516
- Issue date Jul 5, 2022
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generating and analyzing roughness measuremen...
- Patent number 11,361,937
- Issue date Jun 14, 2022
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generating and analyzing roughness measuremen...
- Patent number 11,355,306
- Issue date Jun 7, 2022
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Edge detection system
- Patent number 11,004,653
- Issue date May 11, 2021
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generating and analyzing roughness measurements
- Patent number 11,004,654
- Issue date May 11, 2021
- Fractilia, LLC
- Chris Mack
- G01 - MEASURING TESTING
Information Patent Grant
Edge detection system and its use for machine learning
- Patent number 10,664,955
- Issue date May 26, 2020
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generating and analyzing roughness measurements
- Patent number 10,665,417
- Issue date May 26, 2020
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generating and analyzing roughness measurements
- Patent number 10,665,418
- Issue date May 26, 2020
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Edge detection system and its use for optical proximity correction
- Patent number 10,656,532
- Issue date May 19, 2020
- Fractilia, LLC
- Chris Mack
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for generating and analyzing roughness measuremen...
- Patent number 10,648,801
- Issue date May 12, 2020
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generating and analyzing roughness measurements
- Patent number 10,522,322
- Issue date Dec 31, 2019
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Edge detection system
- Patent number 10,510,509
- Issue date Dec 17, 2019
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for removing noise from roughness measurements
- Patent number 10,488,188
- Issue date Nov 26, 2019
- Fractilia, LLC
- Chris Mack
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Edge detection system
- Patent number 10,176,966
- Issue date Jan 8, 2019
- Fractilia, LLC
- Chris Mack
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for improved monitor and control of lithography processes
- Patent number 9,188,974
- Issue date Nov 17, 2015
- KLA-Tencor Technologies Corp.
- Chris Mack
- G05 - CONTROLLING REGULATING
Information Patent Grant
Overlay metrology and control method
- Patent number 7,804,994
- Issue date Sep 28, 2010
- KLA-Tencor Technologies Corporation
- Michael Adel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for determining lithographic focus and exposure
- Patent number 7,656,512
- Issue date Feb 2, 2010
- KLA-Tencor Technologies Corporation
- Walter D. Mieher
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Feature printability optimization by optical tool
- Patent number 7,566,517
- Issue date Jul 28, 2009
- KLA-Tencor Technologies Corp.
- Michael E. Adel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Target acquisition and overlay metrology based on two diffracted or...
- Patent number 7,528,953
- Issue date May 5, 2009
- KLA-Tencor Technologies Corp.
- Aviv Frommer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for determining lithographic focus and exposure
- Patent number 7,382,447
- Issue date Jun 3, 2008
- KLA-Tencor Technologies Corporation
- Walter Mieher
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measuring phase errors on phase shift masks
- Patent number 7,368,208
- Issue date May 6, 2008
- KLA-Tencor Technologies Corp.
- Michael Adel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for process optimization and control by comparison between 2...
- Patent number 7,352,453
- Issue date Apr 1, 2008
- KLA-Tencor Technologies Corporation
- Walter D. Mieher
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for modifying a reticle's optical properties
- Patent number 7,303,842
- Issue date Dec 4, 2007
- KLA-Tencor Technologies Corporation
- Sterling G. Watson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for monitoring a reticle
- Patent number 7,300,729
- Issue date Nov 27, 2007
- KLA-Tencor Technologies Corporation
- Sterling G. Watson
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...
- Publication number 20240312757
- Publication date Sep 19, 2024
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of Dispositioning and Control of a Semiconductor Manufacturi...
- Publication number 20240258066
- Publication date Aug 1, 2024
- FRACTILIA, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS
- Publication number 20230326711
- Publication date Oct 12, 2023
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING AND/OR PREDICTING UNBIASED PARAME...
- Publication number 20230134093
- Publication date May 4, 2023
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...
- Publication number 20220146947
- Publication date May 12, 2022
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION OF PROBABILISTIC PROCESS WINDOWS
- Publication number 20220068594
- Publication date Mar 3, 2022
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS
- Publication number 20210327675
- Publication date Oct 21, 2021
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EDGE DETECTION SYSTEM
- Publication number 20210265131
- Publication date Aug 26, 2021
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR PREDICTING STOCHASTIC-AWARE PROCESS WINDOW AN...
- Publication number 20210225609
- Publication date Jul 22, 2021
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR LOW-NOISE EDGE DETECTION AND ITS USE FOR PROC...
- Publication number 20210202204
- Publication date Jul 1, 2021
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...
- Publication number 20210142977
- Publication date May 13, 2021
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...
- Publication number 20210082658
- Publication date Mar 18, 2021
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...
- Publication number 20210066027
- Publication date Mar 4, 2021
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS
- Publication number 20200211813
- Publication date Jul 2, 2020
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EDGE DETECTION SYSTEM
- Publication number 20200118789
- Publication date Apr 16, 2020
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EDGE DETECTION SYSTEM AND ITS USE FOR MACHINE LEARNING
- Publication number 20190272623
- Publication date Sep 5, 2019
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EDGE DETECTION SYSTEM AND ITS USE FOR OPTICAL PROXIMITY CORRECTION
- Publication number 20190187570
- Publication date Jun 20, 2019
- FRACTILIA, LLC
- Chris MACK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...
- Publication number 20190186909
- Publication date Jun 20, 2019
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS
- Publication number 20190180977
- Publication date Jun 13, 2019
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS
- Publication number 20190180976
- Publication date Jun 13, 2019
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS
- Publication number 20190164303
- Publication date May 30, 2019
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EDGE DETECTION SYSTEM
- Publication number 20190139736
- Publication date May 9, 2019
- FRACTILIA, LLC
- Chris MACK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR REMOVING NOISE FROM ROUGHNESS MEASUREMENTS
- Publication number 20190113338
- Publication date Apr 18, 2019
- FRACTILIA, LLC
- Chris MACK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RESOLUTION ENHANCEMENT TECHNIQUES COMBINING INTERFERENCE-ASSISTED L...
- Publication number 20090117491
- Publication date May 7, 2009
- Applied Materials, Inc.
- Rudolf Hendel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
RESOLUTION ENHANCEMENT TECHNIQUES COMBINING FOUR BEAM INTERFERENCE-...
- Publication number 20090111056
- Publication date Apr 30, 2009
- Applied Materials, Inc.
- Rudolf Hendel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR DETERMINING LITHOGRAPHIC FOCUS AND EXPOSURE
- Publication number 20080192221
- Publication date Aug 14, 2008
- KLA-Tencor Technologies Corporation
- Walter Mieher
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Systems and methods for mitigating variances on a patterned wafer u...
- Publication number 20060240336
- Publication date Oct 26, 2006
- KLA-Tencor Technologies Corporation
- Sterling G. Watson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for determining and correcting reticle variations
- Publication number 20060234145
- Publication date Oct 19, 2006
- KLA-Tencor Technologies Corporation
- Sterling G. Watson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Systems and methods for modifying a reticle's optical properties
- Publication number 20060234139
- Publication date Oct 19, 2006
- KLA-Tencor Technologies Corporation
- Sterling G. Watson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for monitoring a reticle
- Publication number 20060234144
- Publication date Oct 19, 2006
- KLA-Tencor Technologies Corporation
- Sterling G. Watson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Person

Patents Grantslast 30 patents

Detection of probabilistic process windows

System and method for generating and analyzing roughness measuremen...

System and method for generating and analyzing roughness measurements

Edge detection system

System and method for predicting stochastic-aware process window an...

System and method for low-noise edge detection and its use for proc...

System and method for generating and analyzing roughness measuremen...

System and method for generating and analyzing roughness measuremen...

System and method for generating and analyzing roughness measuremen...

Edge detection system

System and method for generating and analyzing roughness measurements

Edge detection system and its use for machine learning

System and method for generating and analyzing roughness measurements

System and method for generating and analyzing roughness measurements

Edge detection system and its use for optical proximity correction

System and method for generating and analyzing roughness measuremen...

System and method for generating and analyzing roughness measurements

Edge detection system

System and method for removing noise from roughness measurements

Edge detection system

Methods for improved monitor and control of lithography processes

Overlay metrology and control method

Method for determining lithographic focus and exposure

Feature printability optimization by optical tool

Target acquisition and overlay metrology based on two diffracted or...

Method for determining lithographic focus and exposure

Measuring phase errors on phase shift masks

Method for process optimization and control by comparison between 2...

Systems and methods for modifying a reticle's optical properties

Method for monitoring a reticle

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...

Method of Dispositioning and Control of a Semiconductor Manufacturi...

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS

SYSTEM AND METHOD FOR DETERMINING AND/OR PREDICTING UNBIASED PARAME...

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...

DETECTION OF PROBABILISTIC PROCESS WINDOWS

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS

EDGE DETECTION SYSTEM

SYSTEM AND METHOD FOR PREDICTING STOCHASTIC-AWARE PROCESS WINDOW AN...

SYSTEM AND METHOD FOR LOW-NOISE EDGE DETECTION AND ITS USE FOR PROC...

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS

EDGE DETECTION SYSTEM

EDGE DETECTION SYSTEM AND ITS USE FOR MACHINE LEARNING

EDGE DETECTION SYSTEM AND ITS USE FOR OPTICAL PROXIMITY CORRECTION

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS

EDGE DETECTION SYSTEM

SYSTEM AND METHOD FOR REMOVING NOISE FROM ROUGHNESS MEASUREMENTS

RESOLUTION ENHANCEMENT TECHNIQUES COMBINING INTERFERENCE-ASSISTED L...

RESOLUTION ENHANCEMENT TECHNIQUES COMBINING FOUR BEAM INTERFERENCE-...

METHOD FOR DETERMINING LITHOGRAPHIC FOCUS AND EXPOSURE

Systems and methods for mitigating variances on a patterned wafer u...

Method for determining and correcting reticle variations

Systems and methods for modifying a reticle's optical properties

Method for monitoring a reticle