Chris Maher

Person

Campbell, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Defect discovery and recipe optimization for inspection of three-di...
- Patent number 11,047,806
- Issue date Jun 29, 2021
- KLA-Tencor Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for region-adaptive defect detection
- Patent number 10,535,131
- Issue date Jan 14, 2020
- KLA-Tencor Corporation
- Christopher Maher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High-speed hotspot or defect imaging with a charged particle beam s...
- Patent number 9,754,761
- Issue date Sep 5, 2017
- KLA-Tencor Corporation
- Hong Xiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Decision tree construction for automatic classification of defects...
- Patent number 9,489,599
- Issue date Nov 8, 2016
- KLA-Tencor Corp.
- Chien-Huei (Adam) Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Contour-based array inspection of patterned defects
- Patent number 9,483,819
- Issue date Nov 1, 2016
- KLA-Tencor Corporation
- Chien-Huei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Region based virtual fourier filter
- Patent number 8,989,479
- Issue date Mar 24, 2015
- KLA-Tencor Corporation
- Lisheng Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Monitoring of time-varying defect classification performance
- Patent number 8,537,349
- Issue date Sep 17, 2013
- KLA-Tencor Corporation
- Patrick Huet
- G05 - CONTROLLING REGULATING
Information Patent Grant
Computer-implemented methods, carrier media, and systems for creati...
- Patent number 8,135,204
- Issue date Mar 13, 2012
- KLA-Tencor Technologies Corp.
- Chien-Huei (Adam) Chen
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for creating persistent data for a wafer and fo...
- Patent number 8,126,255
- Issue date Feb 28, 2012
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer-implemented methods, computer-readable media, and systems...
- Patent number 8,073,240
- Issue date Dec 6, 2011
- KLA-Tencor Corp.
- Verlyn Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for generating information to be used for selec...
- Patent number 8,000,922
- Issue date Aug 16, 2011
- KLA-Tencor Corp.
- Hong Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Defect Candidate Generation for Inspection
- Publication number 20200328104
- Publication date Oct 15, 2020
- KLA Corporation
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN AND NOISE BASED CARE AREAS
- Publication number 20200126212
- Publication date Apr 23, 2020
- KLA-Tencor Corporation
- Brian Duffy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Discovery And Recipe Optimization For Inspection Of Three-Di...
- Publication number 20180149603
- Publication date May 31, 2018
- KLA-Tencor Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Region-Adaptive Defect Detection
- Publication number 20170140516
- Publication date May 18, 2017
- KLA-Tencor Corporation
- Christopher Maher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH-SPEED HOTSPOT OR DEFECT IMAGING WITH A CHARGED PARTICLE BEAM S...
- Publication number 20160351373
- Publication date Dec 1, 2016
- KLA-Tencor Corporation
- Hong Xiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Decision Tree Construction for Automatic Classification of Defects...
- Publication number 20150125064
- Publication date May 7, 2015
- KLA-Tencor Corporation
- Chien-Huei (Adam) Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTOUR-BASED ARRAY INSPECTION OF PATTERNED DEFECTS
- Publication number 20140212024
- Publication date Jul 31, 2014
- KLA-Tencor Corporation
- Chien-Huei CHEN
- G01 - MEASURING TESTING
Information Patent Application
REGION BASED VIRTUAL FOURIER FILTER
- Publication number 20120141013
- Publication date Jun 7, 2012
- KLA-Tencor Corporation
- Lisheng Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MONITORING OF TIME-VARYING DEFECT CLASSIFICATION PERFORMANCE
- Publication number 20110224932
- Publication date Sep 15, 2011
- KLA-Tencor Corporation
- Patrick Huet
- G05 - CONTROLLING REGULATING
Information Patent Application
METHODS AND SYSTEMS FOR GENERATING INFORMATION TO BE USED FOR SELEC...
- Publication number 20090299681
- Publication date Dec 3, 2009
- Hong Chen
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CREATING PERSISTENT DATA FOR A WAFER AND FO...
- Publication number 20090080759
- Publication date Mar 26, 2009
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTER-IMPLEMENTED METHODS, COMPUTER-READABLE MEDIA, AND SYSTEMS...
- Publication number 20080279444
- Publication date Nov 13, 2008
- Verlyn Fischer
- G01 - MEASURING TESTING

Chris Maher

Person

Patents Grantslast 30 patents

Defect discovery and recipe optimization for inspection of three-di...

Systems and methods for region-adaptive defect detection

High-speed hotspot or defect imaging with a charged particle beam s...

Decision tree construction for automatic classification of defects...

Contour-based array inspection of patterned defects

Region based virtual fourier filter

Monitoring of time-varying defect classification performance

Computer-implemented methods, carrier media, and systems for creati...

Systems and methods for creating persistent data for a wafer and fo...

Computer-implemented methods, computer-readable media, and systems...

Methods and systems for generating information to be used for selec...

Patents Applicationslast 30 patents

Defect Candidate Generation for Inspection

DESIGN AND NOISE BASED CARE AREAS

Defect Discovery And Recipe Optimization For Inspection Of Three-Di...

Systems and Methods for Region-Adaptive Defect Detection

HIGH-SPEED HOTSPOT OR DEFECT IMAGING WITH A CHARGED PARTICLE BEAM S...

Decision Tree Construction for Automatic Classification of Defects...

CONTOUR-BASED ARRAY INSPECTION OF PATTERNED DEFECTS

REGION BASED VIRTUAL FOURIER FILTER

MONITORING OF TIME-VARYING DEFECT CLASSIFICATION PERFORMANCE

METHODS AND SYSTEMS FOR GENERATING INFORMATION TO BE USED FOR SELEC...

SYSTEMS AND METHODS FOR CREATING PERSISTENT DATA FOR A WAFER AND FO...

COMPUTER-IMPLEMENTED METHODS, COMPUTER-READABLE MEDIA, AND SYSTEMS...