Chris P. Nappi

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for concurrently testing master and slave devic...
- Patent number 9,645,963
- Issue date May 9, 2017
- NXP USA, INC.
- Chris N. Stoll
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device having a test controller and method of operation
- Patent number 9,412,467
- Issue date Aug 9, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Chris P. Nappi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
DATA PROCESSING SYSTEM WITH BUILT-IN SELF-TEST AND METHOD THEREFOR
- Publication number 20170082686
- Publication date Mar 23, 2017
- FREESCALE SEMICONDUCTOR, INC.
- COLIN MACDONALD
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CONCURRENTLY TESTING MASTER AND SLAVE DEVIC...
- Publication number 20160238654
- Publication date Aug 18, 2016
- FREESCALE SEMICONDUCTOR, INC.
- CHRIS N. STOLL
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE HAVING A TEST CONTROLLER AND METHOD OF OPERATION
- Publication number 20150310932
- Publication date Oct 29, 2015
- CHRIS P. NAPPI
- G11 - INFORMATION STORAGE