Chris Pawlowicz

Person

Ottawa, CA

People

Patents Grantslast 30 patents

Information Patent Grant
Ion beam chamber fluid delivery apparatus and method and ion beam e...
- Patent number 12,176,177
- Issue date Dec 24, 2024
- Techinsights Inc.
- Christopher Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam delayering system and method, topographically enhanced del...
- Patent number 12,165,840
- Issue date Dec 10, 2024
- Techinsights Inc.
- Christopher Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for ion beam delayering of a sample and control t...
- Patent number 11,214,874
- Issue date Jan 4, 2022
- Techinsights Inc.
- Robert K. Foster
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for ion beam delayering of a sample and control t...
- Patent number 10,689,763
- Issue date Jun 23, 2020
- Techinsights Inc.
- Robert K. Foster
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and system for ion beam delayering of a sample and control t...
- Patent number 10,550,480
- Issue date Feb 4, 2020
- TECHINSIGHTS INC.
- Robert K. Foster
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Methods, systems and devices relating to distortion correction in i...
- Patent number 10,469,777
- Issue date Nov 5, 2019
- TECHINSIGHTS INC.
- Christopher Pawlowicz
- G01 - MEASURING TESTING
Information Patent Grant
Circuit tracing using a focused ion beam
- Patent number 9,915,628
- Issue date Mar 13, 2018
- TECHINSIGHTS INC.
- Christopher Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for ion beam delayering of a sample and control t...
- Patent number 9,534,299
- Issue date Jan 3, 2017
- Techinsights Inc.
- Robert K. Foster
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Circuit tracing using a focused ion beam
- Patent number 9,529,040
- Issue date Dec 27, 2016
- TECHINSIGHTS INC.
- Christopher Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit tracing using a focused ion beam
- Patent number 9,383,327
- Issue date Jul 5, 2016
- TECHINSIGHTS INC.
- Chris Pawlowicz
- G01 - MEASURING TESTING
Information Patent Grant
Circuit tracing using a focused ion beam
- Patent number 8,791,436
- Issue date Jul 29, 2014
- Chris Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MACHINE LEARNING SYSTEM AND METHOD FOR OBJECT-SPECIFIC RECOGNITION
- Publication number 20250014323
- Publication date Jan 9, 2025
- TECHINSIGHTS INC.
- Christopher PAWLOWICZ
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTRAST-ENHANCING STAINING SYSTEM AND METHOD AND IMAGING METHODS A...
- Publication number 20230273256
- Publication date Aug 31, 2023
- TECHINSIGHTS INC.
- Christopher Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR IMAGE SEGMENTATION FROM SPARSE PARTICLE IMPIN...
- Publication number 20230196581
- Publication date Jun 22, 2023
- TECHINSIGHTS INC.
- Christopher PAWLOWICZ
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ION BEAM CHAMBER FLUID DELIVERY APPARATUS AND METHOD AND ION BEAM E...
- Publication number 20220399179
- Publication date Dec 15, 2022
- TECHINSIGHTS INC.
- Christopher PAWLOWICZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DELAYERING SYSTEM AND METHOD, AND ENDPOINT MONITORING SYST...
- Publication number 20220122805
- Publication date Apr 21, 2022
- TechInsights Inc.
- Christopher PAWLOWICZ
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ION BEAM DELAYERING SYSTEM AND METHOD, TOPOGRAPHICALLY ENHANCED DEL...
- Publication number 20220005669
- Publication date Jan 6, 2022
- TechInsights Inc.
- Christopher PAWLOWICZ
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ION BEAM DELAYERING OF A SAMPLE AND CONTROL T...
- Publication number 20200318242
- Publication date Oct 8, 2020
- TECHINSIGHTS INC.
- Robert K. Foster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS, SYSTEMS AND DEVICES RELATING TO DISTORTION CORRECTION IN I...
- Publication number 20180054575
- Publication date Feb 22, 2018
- TECHINSIGHTS INC.
- Christopher PAWLOWICZ
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ION BEAM DELAYERING OF A SAMPLE AND CONTROL T...
- Publication number 20170096741
- Publication date Apr 6, 2017
- TECHINSIGHTS INC.
- Robert K. Foster
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD AND SYSTEM FOR ION BEAM DELAYERING OF A SAMPLE AND CONTROL T...
- Publication number 20170089813
- Publication date Mar 30, 2017
- TECHINSIGHTS INC.
- Robert K. Foster
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT TRACING USING A FOCUSED ION BEAM
- Publication number 20160282287
- Publication date Sep 29, 2016
- TECHINSIGHTS INC.
- Christopher PAWLOWICZ
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT TRACING USING A FOCUSED ION BEAM
- Publication number 20160187419
- Publication date Jun 30, 2016
- TECHINSIGHTS INC.
- Christopher PAWLOWICZ
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT TRACING USING A FOCUSED ION BEAM
- Publication number 20140319343
- Publication date Oct 30, 2014
- Chris Pawlowicz
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ION BEAM DELAYERING OF A SAMPLE AND CONTROL T...
- Publication number 20130118896
- Publication date May 16, 2013
- Semiconductor Insights Inc.
- Robert K. Foster
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Chris Pawlowicz

Person

Patents Grantslast 30 patents

Ion beam chamber fluid delivery apparatus and method and ion beam e...

Ion beam delayering system and method, topographically enhanced del...

Method and system for ion beam delayering of a sample and control t...

Method and system for ion beam delayering of a sample and control t...

Method and system for ion beam delayering of a sample and control t...

Methods, systems and devices relating to distortion correction in i...

Circuit tracing using a focused ion beam

Method and system for ion beam delayering of a sample and control t...

Circuit tracing using a focused ion beam

Circuit tracing using a focused ion beam

Circuit tracing using a focused ion beam

Patents Applicationslast 30 patents

MACHINE LEARNING SYSTEM AND METHOD FOR OBJECT-SPECIFIC RECOGNITION

CONTRAST-ENHANCING STAINING SYSTEM AND METHOD AND IMAGING METHODS A...

SYSTEM AND METHOD FOR IMAGE SEGMENTATION FROM SPARSE PARTICLE IMPIN...

ION BEAM CHAMBER FLUID DELIVERY APPARATUS AND METHOD AND ION BEAM E...

ION BEAM DELAYERING SYSTEM AND METHOD, AND ENDPOINT MONITORING SYST...

ION BEAM DELAYERING SYSTEM AND METHOD, TOPOGRAPHICALLY ENHANCED DEL...

METHOD AND SYSTEM FOR ION BEAM DELAYERING OF A SAMPLE AND CONTROL T...

METHODS, SYSTEMS AND DEVICES RELATING TO DISTORTION CORRECTION IN I...

METHOD AND SYSTEM FOR ION BEAM DELAYERING OF A SAMPLE AND CONTROL T...

METHOD AND SYSTEM FOR ION BEAM DELAYERING OF A SAMPLE AND CONTROL T...

CIRCUIT TRACING USING A FOCUSED ION BEAM

CIRCUIT TRACING USING A FOCUSED ION BEAM

CIRCUIT TRACING USING A FOCUSED ION BEAM

METHOD AND SYSTEM FOR ION BEAM DELAYERING OF A SAMPLE AND CONTROL T...