Chris R. Jacobsen

Person

Astoria, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Instrumentation chassis with single output AC to DC power supply an...
- Patent number 10,840,701
- Issue date Nov 17, 2020
- Keysight Technologies, Inc.
- Kuen Yew Lam Yew Lam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cooling apparatus and methods of use
- Patent number 10,533,809
- Issue date Jan 14, 2020
- Keysight Technologies, Inc.
- David Lionel Sherrer
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Instrumentation chassis including integrated accelerator module
- Patent number 9,870,333
- Issue date Jan 16, 2018
- Keysight Technologies, Inc.
- Kuen Yew Lam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for manufacturing and probing printed circuit...
- Patent number 7,504,589
- Issue date Mar 17, 2009
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining probing locations for a printe...
- Patent number 7,325,219
- Issue date Jan 29, 2008
- Agilent Technologies, Inc.
- Chris R. Jacobsen
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for unpowered testing of open connections on...
- Patent number 7,307,426
- Issue date Dec 11, 2007
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for engineering a testability interposer for t...
- Patent number 7,307,427
- Issue date Dec 11, 2007
- Agilent Technologies, Inc.
- Chris R. Jacobsen
- G01 - MEASURING TESTING
Information Patent Grant
Method for non-contact testing of marginal integrated circuit conne...
- Patent number 7,295,031
- Issue date Nov 13, 2007
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for a twisting fixture probe for probing test...
- Patent number 7,259,576
- Issue date Aug 21, 2007
- Agilent Technologies, Inc.
- Kenneth P Parker
- G01 - MEASURING TESTING
Information Patent Grant
Method for non-contact testing of fixed and inaccessible connection...
- Patent number 7,208,957
- Issue date Apr 24, 2007
- Agilent Technologies, Inc.
- Myron J. Schneider
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for implicitly encoding preferred probing locatio...
- Patent number 7,187,165
- Issue date Mar 6, 2007
- Agilent Technologies, Inc.
- Chris R. Jacobsen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for non-contact testing and diagnosing electri...
- Patent number 7,123,022
- Issue date Oct 17, 2006
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Adapter method and apparatus for interfacing a tester with a device...
- Patent number 7,009,381
- Issue date Mar 7, 2006
- Agilent Technologies, Inc.
- Chris R. Jacobsen
- G01 - MEASURING TESTING
Information Patent Grant
Circuit board coupon tester
- Patent number 6,828,778
- Issue date Dec 7, 2004
- Agilent Technologies, Inc.
- Chris R Jacobsen
- G01 - MEASURING TESTING
Information Patent Grant
Circuit board coupon tester
- Patent number 6,664,778
- Issue date Dec 16, 2003
- Agilent Technologies, Inc.
- Chris R Jacobsen
- G01 - MEASURING TESTING
Information Patent Grant
Modular mechanical fixturing and automated handling of printed circ...
- Patent number 6,307,386
- Issue date Oct 23, 2001
- Agilent Technologies, Inc.
- Dwight Fowler
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable fast press with PCA shuttle and modular expansion capabi...
- Patent number 6,191,572
- Issue date Feb 20, 2001
- Agilent Technologies Inc.
- Dwight Fowler
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR TESTING DEVICE UNDER TEST USING REMOTE DATA CENTER
- Publication number 20240220380
- Publication date Jul 4, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Jared Richard
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COOLING APPARATUS AND METHODS OF USE
- Publication number 20200011620
- Publication date Jan 9, 2020
- Keysight Technologies, Inc.
- David Lionel Sherrer
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
INSTRUMENTATION CHASSIS WITH SINGLE OUTPUT AC TO DC POWER SUPPLY AN...
- Publication number 20190372344
- Publication date Dec 5, 2019
- KEYSIGHT TECHNOLOGIES, INC.
- Kuen Yew Lam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Tracking Manufacturing Test Changes
- Publication number 20100005123
- Publication date Jan 7, 2010
- AGILENT TECHNOLOGIES, INC.
- Dayton Norrgard
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Printed circuit board for coupling probes to a tester, and apparatu...
- Publication number 20090179657
- Publication date Jul 16, 2009
- Eddie Lee Williamson
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus using one or more supernodes when testing for...
- Publication number 20080315892
- Publication date Dec 25, 2008
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Method for improving a printed circuit board development cycle
- Publication number 20080148208
- Publication date Jun 19, 2008
- Chris R. Jacobsen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method and apparatus for engineering a testability interposer for t...
- Publication number 20070018672
- Publication date Jan 25, 2007
- Chris R. Jacobsen
- G01 - MEASURING TESTING
Information Patent Application
In-circuit test fixture with integral vision inspection system
- Publication number 20070013772
- Publication date Jan 18, 2007
- Yew Fei Tham
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for unpowered testing of open connections on...
- Publication number 20070013383
- Publication date Jan 18, 2007
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Non-Contact Testing and Diagnosing Electri...
- Publication number 20070007978
- Publication date Jan 11, 2007
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for a twisting fixture probe for probing test...
- Publication number 20060202675
- Publication date Sep 14, 2006
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Method for non-contact testing of fixed and inaccessible connection...
- Publication number 20060197539
- Publication date Sep 7, 2006
- Myron J. Schneider
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for determining probing locations for a printe...
- Publication number 20060192579
- Publication date Aug 31, 2006
- Chris R. Jacobsen
- G01 - MEASURING TESTING
Information Patent Application
Printed circuit board development cycle using probe location automa...
- Publication number 20060129955
- Publication date Jun 15, 2006
- Chris R. Jacobsen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method and system for implicitly encoding preferred probing locatio...
- Publication number 20060125496
- Publication date Jun 15, 2006
- Chris R. Jacobsen
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for a twisting fixture probe for probing test...
- Publication number 20060103397
- Publication date May 18, 2006
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for manufacturing and probing printed circuit...
- Publication number 20060097737
- Publication date May 11, 2006
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for non-contact testing and diagnosing electri...
- Publication number 20050242824
- Publication date Nov 3, 2005
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Application
Adapter method and apparatus for interfacing a tester with a device...
- Publication number 20040108848
- Publication date Jun 10, 2004
- Chris R. Jacobsen
- G01 - MEASURING TESTING
Information Patent Application
Circuit board coupon tester
- Publication number 20040080310
- Publication date Apr 29, 2004
- Chris R. Jacobsen
- G01 - MEASURING TESTING
Information Patent Application
Circuit board coupon tester
- Publication number 20020175672
- Publication date Nov 28, 2002
- Chris R. Jacobsen
- G01 - MEASURING TESTING

Chris R. Jacobsen

Person

Patents Grantslast 30 patents

Instrumentation chassis with single output AC to DC power supply an...

Cooling apparatus and methods of use

Instrumentation chassis including integrated accelerator module

Method and apparatus for manufacturing and probing printed circuit...

Method and apparatus for determining probing locations for a printe...

Methods and apparatus for unpowered testing of open connections on...

Method and apparatus for engineering a testability interposer for t...

Method for non-contact testing of marginal integrated circuit conne...

Method and apparatus for a twisting fixture probe for probing test...

Method for non-contact testing of fixed and inaccessible connection...

Method and system for implicitly encoding preferred probing locatio...

Method and apparatus for non-contact testing and diagnosing electri...

Adapter method and apparatus for interfacing a tester with a device...

Circuit board coupon tester

Circuit board coupon tester

Modular mechanical fixturing and automated handling of printed circ...

Adjustable fast press with PCA shuttle and modular expansion capabi...

Patents Applicationslast 30 patents

SYSTEM FOR TESTING DEVICE UNDER TEST USING REMOTE DATA CENTER

COOLING APPARATUS AND METHODS OF USE

INSTRUMENTATION CHASSIS WITH SINGLE OUTPUT AC TO DC POWER SUPPLY AN...

Tracking Manufacturing Test Changes

Printed circuit board for coupling probes to a tester, and apparatu...

Methods and apparatus using one or more supernodes when testing for...

Method for improving a printed circuit board development cycle

Method and apparatus for engineering a testability interposer for t...

In-circuit test fixture with integral vision inspection system

Methods and apparatus for unpowered testing of open connections on...

Method and Apparatus for Non-Contact Testing and Diagnosing Electri...

Method and apparatus for a twisting fixture probe for probing test...

Method for non-contact testing of fixed and inaccessible connection...

Method and apparatus for determining probing locations for a printe...

Printed circuit board development cycle using probe location automa...

Method and system for implicitly encoding preferred probing locatio...

Method and apparatus for a twisting fixture probe for probing test...

Method and apparatus for manufacturing and probing printed circuit...

Method and apparatus for non-contact testing and diagnosing electri...

Adapter method and apparatus for interfacing a tester with a device...

Circuit board coupon tester

Circuit board coupon tester