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Chris Raymond
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Bend, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Silicon filter for photoluminescence metrology
Patent number
8,330,946
Issue date
Dec 11, 2012
Nanometrics Incorporated
Andrzej Buczkowski
G01 - MEASURING TESTING
Information
Patent Grant
Method for evaluating microstructures on a workpiece based on the o...
Patent number
8,027,037
Issue date
Sep 27, 2011
Nanometrics Incorporated
Mike Littau
G01 - MEASURING TESTING
Information
Patent Grant
Method for evaluating microstructures on a workpiece based on the o...
Patent number
7,656,542
Issue date
Feb 2, 2010
Nanometrics Incorporated
Mike Littau
G01 - MEASURING TESTING
Information
Patent Grant
Line profile asymmetry measurement
Patent number
7,639,371
Issue date
Dec 29, 2009
Nanometrics Incorporated
Christopher Raymond
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for enhanced critical dimension scatterometry
Patent number
7,615,752
Issue date
Nov 10, 2009
Nanometrics Incorporated
Chris Raymond
G01 - MEASURING TESTING
Information
Patent Grant
Line profile asymmetry measurement
Patent number
7,515,279
Issue date
Apr 7, 2009
Nanometrics Incorporated
Christopher Raymond
G01 - MEASURING TESTING
Information
Patent Grant
Scatterometer having a computer system that reads data from selecte...
Patent number
7,511,293
Issue date
Mar 31, 2009
Nanometrics Incorporated
Chris Raymond
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for enhanced critical dimension scatterometry
Patent number
7,502,101
Issue date
Mar 10, 2009
Nanometrics Incorporated
Chris Raymond
G01 - MEASURING TESTING
Information
Patent Grant
Determination of center of focus by parameter variability analysis
Patent number
7,119,893
Issue date
Oct 10, 2006
Accent Optical Technologies, Inc.
Michael E. Littau
G01 - MEASURING TESTING
Information
Patent Grant
Determination of center of focus by cross-section analysis
Patent number
7,110,099
Issue date
Sep 19, 2006
Accent Optical Technologies, Inc.
Michael E. Littau
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Line profile asymmetry measurement using scatterometry
Patent number
6,856,408
Issue date
Feb 15, 2005
Accent Optical Technologies, Inc.
Christopher J. Raymond
G01 - MEASURING TESTING
Information
Patent Grant
Structure identification using scattering signatures
Patent number
6,728,663
Issue date
Apr 27, 2004
Accent Optical Technologies, Inc.
Richard H. Krukar
G01 - MEASURING TESTING
Information
Patent Grant
Determination of center of focus by diffraction signature analysis
Patent number
6,606,152
Issue date
Aug 12, 2003
Accent Optical Technologies, Inc.
Michael E. Littau
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Determination of center of focus by diffraction signature analysis
Patent number
6,429,930
Issue date
Aug 6, 2002
Accent Optical Technologies, Inc.
Michael E. Littau
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
Silicon Filter for Photoluminescence Metrology
Publication number
20110141460
Publication date
Jun 16, 2011
Nanometrics Incorporated
Andrzej Buczkowski
G01 - MEASURING TESTING
Information
Patent Application
Method for Evaluating Microstructures on a Workpiece Based on the O...
Publication number
20100135571
Publication date
Jun 3, 2010
Nanometrics Incorporated
Mike Littau
G01 - MEASURING TESTING
Information
Patent Application
Line Profile Asymmetry Measurement
Publication number
20090190138
Publication date
Jul 30, 2009
Nanometrics Incorporated
Christopher Raymond
G01 - MEASURING TESTING
Information
Patent Application
Method for evaluating microstructures on a workpiece based on the o...
Publication number
20070211261
Publication date
Sep 13, 2007
Mike Littau
G01 - MEASURING TESTING
Information
Patent Application
Line Profile Asymmetry Measurement
Publication number
20070201043
Publication date
Aug 30, 2007
Accent Optical Technologies, Inc.
Christopher Raymond
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for enhanced critical dimension scatterometry
Publication number
20060289788
Publication date
Dec 28, 2006
Accent Optical Technologies, Inc.
Chris Raymond
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for enhanced critical dimension scatterometry
Publication number
20060289789
Publication date
Dec 28, 2006
Accent Optical Technologies, Inc.
Chris Raymond
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for enhanced critical dimension scatterometry
Publication number
20060289790
Publication date
Dec 28, 2006
Accent Optical Technologies, Inc.
Chris Raymond
G01 - MEASURING TESTING
Information
Patent Application
Apparatuses and methods for enhanced critical dimension scatterometry
Publication number
20060285111
Publication date
Dec 21, 2006
Accent Optical Technologies, Inc.
Chris Raymond
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for enhanced critical dimension scatterometry
Publication number
20060285110
Publication date
Dec 21, 2006
Accent Optical Technologies, Inc.
Chris Raymond
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for enhanced critical dimension scatterometry
Publication number
20060278834
Publication date
Dec 14, 2006
Accent Optical Technologies, Inc.
Chris Raymond
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for enhanced critical dimension scatterometry
Publication number
20060273263
Publication date
Dec 7, 2006
Accent Optical Technologies, Inc.
Chris Raymond
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for enhanced critical dimension scatterometry
Publication number
20060243912
Publication date
Nov 2, 2006
Accent Optical Technologies, Inc.
Chris Raymond
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHODS FOR SCATTEROMETRY OF OPTICAL DEVICES
Publication number
20060244969
Publication date
Nov 2, 2006
Tom W. Ryan
G01 - MEASURING TESTING
Information
Patent Application
Determination of center of focus by parameter variability analysis
Publication number
20040233445
Publication date
Nov 25, 2004
Accent Optical Technologies, Inc.
Michael E. Littau
G01 - MEASURING TESTING
Information
Patent Application
Determination of center of focus by cross-section analysis
Publication number
20040223137
Publication date
Nov 11, 2004
Michael E. Littau
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Scatterometric measurement of undercut multi-layer diffracting sign...
Publication number
20030197872
Publication date
Oct 23, 2003
Michael E. Littau
G01 - MEASURING TESTING
Information
Patent Application
Determination of center of focus by diffraction signature analysis
Publication number
20030002031
Publication date
Jan 2, 2003
Michael E. Littau
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Line profile asymmetry measurment using scatterometry
Publication number
20020149782
Publication date
Oct 17, 2002
Christopher J. Raymond
G01 - MEASURING TESTING
Information
Patent Application
Structure identification using scattering signatures
Publication number
20020046008
Publication date
Apr 18, 2002
Richard H. Krukar
G01 - MEASURING TESTING
Information
Patent Application
DETERMINATION OF CENTER OF FOCUS BY DIFFRACTION SIGNATURE ANALYSIS
Publication number
20020041373
Publication date
Apr 11, 2002
Michael Eugene Littau
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY