Chris Schroeder

Person

Tempe, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
System for thermal management of device under test (DUT)
- Patent number 10,281,521
- Issue date May 7, 2019
- Intel Corporation
- David Won-jun Song
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Placing integrated circuit devices using perturbation
- Patent number 9,638,747
- Issue date May 2, 2017
- Intel Corporation
- Paul J. Diglio
- G01 - MEASURING TESTING
Information Patent Grant
Direct liquid-contact micro-channel heat transfer devices, methods...
- Patent number 9,448,278
- Issue date Sep 20, 2016
- Intel Corporation
- Christopher R. Schroeder
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Thermal interface material handling for thermal control of an elect...
- Patent number 9,377,486
- Issue date Jun 28, 2016
- Intel Corporation
- David Won-jun Song
- G01 - MEASURING TESTING
Information Patent Grant
Direct liquid-contact micro-channel heat transfer devices, methods...
- Patent number 9,347,987
- Issue date May 24, 2016
- Intel Corporation
- Christopher R. Schroeder
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Direct liquid-contact micro-channel heat transfer devices, methods...
- Patent number 9,207,274
- Issue date Dec 8, 2015
- Intel Corporation
- Christopher R. Schroeder
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Apparatus and method for linked slot-level burn-in
- Patent number 7,550,964
- Issue date Jun 23, 2009
- Intel Corporation
- Daniel J. Dangelo
- G01 - MEASURING TESTING
Information Patent Grant
System and method for linked slot-level burn-in
- Patent number 7,339,387
- Issue date Mar 4, 2008
- Intel Corporation
- Daniel J. Dangelo
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for linked slot-level burn-in
- Patent number 7,292,023
- Issue date Nov 6, 2007
- Intel Corporation
- Daniel J. Dangelo
- G01 - MEASURING TESTING
Information Patent Grant
PLGA test handler throw measuring unit
- Patent number 6,035,731
- Issue date Mar 14, 2000
- Intel Corporation
- John Langmack
- G01 - MEASURING TESTING
Information Patent Grant
HTMU test handler throw measuring unit
- Patent number 5,948,960
- Issue date Sep 7, 1999
- Intel Corporation
- John Langmack
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR THERMAL MANAGEMENT OF DEVICE UNDER TEST (DUT)
- Publication number 20180156863
- Publication date Jun 7, 2018
- Intel Corporation
- David Won-jun Song
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
DIRECT LIQUID-CONTACT MICRO-CHANNEL HEAT TRANSFER DEVICES, METHODS...
- Publication number 20150285857
- Publication date Oct 8, 2015
- Intel Corporation
- Christopher R. SCHROEDER
- G01 - MEASURING TESTING
Information Patent Application
THERMAL INTERFACE MATERIAL HANDLING FOR THERMAL CONTROL OF AN ELECT...
- Publication number 20150276798
- Publication date Oct 1, 2015
- David Won-jun Song
- G01 - MEASURING TESTING
Information Patent Application
PLACING INTEGRATED CIRCUIT DEVICES USING PERTURBATION
- Publication number 20150185281
- Publication date Jul 2, 2015
- Paul J. Diglio
- G01 - MEASURING TESTING
Information Patent Application
Direct liquid-contact micro-channel heat transfer devices, methods...
- Publication number 20110109335
- Publication date May 12, 2011
- Christopher R. Schroeder
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
APPARATUS AND METHOD FOR LINKED SLOT-LEVEL BURN-IN
- Publication number 20080094095
- Publication date Apr 24, 2008
- Intel Corporation
- Daniel J. Dangelo
- G01 - MEASURING TESTING
Information Patent Application
System and method for linked slot-level burn-in
- Publication number 20060000083
- Publication date Jan 5, 2006
- Daniel J. Dangelo
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for linked slot-level burn-in
- Publication number 20060001436
- Publication date Jan 5, 2006
- Daniel J. Dangelo
- G01 - MEASURING TESTING

Chris Schroeder

Person

Patents Grantslast 30 patents

System for thermal management of device under test (DUT)

Placing integrated circuit devices using perturbation

Direct liquid-contact micro-channel heat transfer devices, methods...

Thermal interface material handling for thermal control of an elect...

Direct liquid-contact micro-channel heat transfer devices, methods...

Direct liquid-contact micro-channel heat transfer devices, methods...

Apparatus and method for linked slot-level burn-in

System and method for linked slot-level burn-in

Apparatus and method for linked slot-level burn-in

PLGA test handler throw measuring unit

HTMU test handler throw measuring unit

Patents Applicationslast 30 patents

SYSTEM FOR THERMAL MANAGEMENT OF DEVICE UNDER TEST (DUT)

DIRECT LIQUID-CONTACT MICRO-CHANNEL HEAT TRANSFER DEVICES, METHODS...

THERMAL INTERFACE MATERIAL HANDLING FOR THERMAL CONTROL OF AN ELECT...

PLACING INTEGRATED CIRCUIT DEVICES USING PERTURBATION

Direct liquid-contact micro-channel heat transfer devices, methods...

APPARATUS AND METHOD FOR LINKED SLOT-LEVEL BURN-IN

System and method for linked slot-level burn-in

Apparatus and method for linked slot-level burn-in