Chris Vogel

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Wylie, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus to test electronic devices
- Patent number 7,843,207
- Issue date Nov 30, 2010
- Texas Instruments Incorporated
- Abidur Rahman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods and Apparatus to Test Electronic Devices
- Publication number 20100164528
- Publication date Jul 1, 2010
- Abidur Rahman
- G01 - MEASURING TESTING