Christiaan Richter

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Rochester, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Doping profile measurement using terahertz time domain spectroscopy...
- Patent number 9,599,555
- Issue date Mar 21, 2017
- Rochester Institute of Technology
- Christiaan Richter
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Doping Profile Measurement Using Terahertz Time Domain Spectroscopy...
- Publication number 20160139044
- Publication date May 19, 2016
- ROCHESTER INSTITUTE OF TECHNOLOGY
- Christiaan Richter
- G01 - MEASURING TESTING