Christian Crueger

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Gerstetten, DE

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Patents Grantslast 30 patents

Information Patent Grant
System comprising a multi-beam particle microscope and method for o...
- Patent number 12,300,462
- Issue date May 13, 2025
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System comprising a multi-beam particle microscope and method for o...
- Patent number 11,935,721
- Issue date Mar 19, 2024
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam particle microscope and method for operating same
- Patent number 9,536,702
- Issue date Jan 3, 2017
- Carl Zeiss Microscopy GmbH
- Uwe Lang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM COMPRISING A MULTI-BEAM PARTICLE MICROSCOPE AND METHOD FOR O...
- Publication number 20240212977
- Publication date Jun 27, 2024
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM COMPRISING A MULTI-BEAM PARTICLE MICROSCOPE AND METHOD FOR O...
- Publication number 20210343499
- Publication date Nov 4, 2021
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM PARTICLE MICROSCOPE AND METHOD FOR OPERATING SAME
- Publication number 20150348749
- Publication date Dec 3, 2015
- CARL ZEISS MICROSCOPY GMBH
- Uwe Lang
- H01 - BASIC ELECTRIC ELEMENTS