Christian Holzner

Follow

Person

Wettringen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Laboratory X-ray micro-tomography system with crystallographic grai...
- Patent number 9,383,324
- Issue date Jul 5, 2016
- Carl Zeiss X-ray Microscopy, Inc.
- Michael Feser
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction method of mapping grain structures in a crystalli...
- Patent number 9,222,900
- Issue date Dec 29, 2015
- Danmarks Tekniske Universitet of Anker Engelundsvej
- Erik Mejdal Lauridsen
- G01 - MEASURING TESTING
Information Patent Grant
Laboratory x-ray micro-tomography system with crystallographic grai...
- Patent number 9,110,004
- Issue date Aug 18, 2015
- Carl Zeiss X-ray Microscopy, Inc.
- Michael Feser
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Laboratory crystallographic x-ray diffraction analysis system
- Publication number 20240219328
- Publication date Jul 4, 2024
- Carl Zeiss X-ray Microscopy, Inc.
- Christian HOLZNER
- G01 - MEASURING TESTING
Information Patent Application
LABORATORY X-RAY MICRO-TOMOGRAPHY SYSTEM WITH CRYSTALLOGRAPHIC GRAI...
- Publication number 20150316493
- Publication date Nov 5, 2015
- Michael Feser
- G01 - MEASURING TESTING
Information Patent Application
Phase Contrast Imaging Using Patterned Illumination/Detector and Ph...
- Publication number 20150055745
- Publication date Feb 26, 2015
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Christian Holzner
- G01 - MEASURING TESTING
Information Patent Application
LABORATORY X-RAY MICRO-TOMOGRAPHY SYSTEM WITH CRYSTALLOGRAPHIC GRAI...
- Publication number 20140112433
- Publication date Apr 24, 2014
- Michael Feser
- G01 - MEASURING TESTING