Christian Jung

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Simonswald, DE

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Patents Grantslast 30 patents

Information Patent Grant
Circuit configuration with serial test interface or serial test ope...
- Patent number 7,761,756
- Issue date Jul 20, 2010
- Micronas GmbH
- Reiner Bidenbach
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Circuit configuration with serial test interface or serial test ope...
- Publication number 20070294605
- Publication date Dec 20, 2007
- Micronas GmbH
- Reiner Bidenbach
- G01 - MEASURING TESTING