Christian KARRAS

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Jena, DE

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Patents Grantslast 30 patents

Information Patent Grant
Wafer-level test method for optoelectronic chips
- Patent number 12,210,057
- Issue date Jan 28, 2025
- Jenoptik Optical Systems GmbH
- Christian Karras
- G01 - MEASURING TESTING
Information Patent Grant
Contacting module for contacting optoelectronic chips
- Patent number 12,203,983
- Issue date Jan 21, 2025
- Jenoptik Optical Systems GmbH
- Robert Buettner
- G01 - MEASURING TESTING
Information Patent Grant
Wafer-level test method for optoelectronic chips
- Patent number 11,906,579
- Issue date Feb 20, 2024
- JENOPTIK GmbH
- Tobias Gnausch
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER-LEVEL TEST METHOD FOR OPTOELECTRONIC CHIPS
- Publication number 20240369624
- Publication date Nov 7, 2024
- JENOPTIK OPTICAL SYSTEMS GMBH
- Christian KARRAS
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE AND METHOD FOR PRODUCING AN OPTICAL DEVICE
- Publication number 20240361542
- Publication date Oct 31, 2024
- JENOPTIK OPTICAL SYSTEMS GMBH
- Christian KARRAS
- G02 - OPTICS
Information Patent Application
CONTACTING MODULE HAVING A MOUNTING PLATE FOR CONTACTING OPTOELECTR...
- Publication number 20240219461
- Publication date Jul 4, 2024
- Robert BUETTNER
- G01 - MEASURING TESTING
Information Patent Application
CONTACTING MODULE FOR CONTACTING OPTOELECTRONIC CHIPS
- Publication number 20230296668
- Publication date Sep 21, 2023
- JENOPTIK OPTICAL SYSTEMS GMBH
- Robert BUETTNER
- G01 - MEASURING TESTING
Information Patent Application
CONTACTING MODULE FOR HAVING A MOUNTING PLATE FOR CONTACTING OPTOEL...
- Publication number 20230288475
- Publication date Sep 14, 2023
- JENOPTIK OPTICAL SYSTEMS GMBH
- Robert BUETTNER
- G01 - MEASURING TESTING
Information Patent Application
WAFER-LEVEL TEST METHOD FOR OPTOELECTRONIC CHIPS
- Publication number 20220397602
- Publication date Dec 15, 2022
- Tobias GNAUSCH
- G01 - MEASURING TESTING