TREA

Christian KOTTLER

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  • Zurich, CH
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Patents Grantslast 30 patents

  • Information Patent Grant

    X-ray interferometer
    • Patent number 10,074,451
    • Issue date Sep 11, 2018
    • CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE S.A.—RECHERCHE ET DEVE...
    • Christian Kottler
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Interferometer device and method
    • Patent number 7,924,973
    • Issue date Apr 12, 2011
    • CSEM Centre Suisse D'Electronique et de Microtechnique SA
    • Christian Kottler
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    X-RAY INTERFEROMETER
    • Publication number 20160377559
    • Publication date Dec 29, 2016
    • CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE SA-RECHERCHE ET DEVELO...
    • Christian KOTTLER
    • G01 - MEASURING TESTING
  • Information Patent Application

    X-RAY INTERFEROMETER
    • Publication number 20130108015
    • Publication date May 2, 2013
    • CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE S.A - RECHERCHE ET DEV...
    • Christian Kottler
    • G02 - OPTICS
  • Information Patent Application

    INTERFEROMETER DEVICE AND METHOD
    • Publication number 20090128830
    • Publication date May 21, 2009
    • Christian KOTTLER
    • G01 - MEASURING TESTING