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Christian Kruger
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Dresden, DE
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Patents Grants
last 30 patents
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Patent Grant
Method of controlling a shape of an oxide layer formed on a substrate
Patent number
6,593,175
Issue date
Jul 15, 2003
Advanced Micro Devices, Inc.
Thomas Feudel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of monitoring the temperature of a rapid thermal anneal proc...
Patent number
6,436,724
Issue date
Aug 20, 2002
Advanced Micro Devices, Inc.
Karsten Wieczorek
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
Implant monitoring using multiple implanting and annealing steps
Publication number
20020059011
Publication date
May 16, 2002
Karsten Wieczorek
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Method of controlling a shape of an oxide layer formed on a substrate
Publication number
20020048970
Publication date
Apr 25, 2002
Thomas Feudel
H01 - BASIC ELECTRIC ELEMENTS