Christian Lemke

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Jena, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method of determining local structures in optical crystals
- Patent number 6,989,904
- Issue date Jan 24, 2006
- Schott AG
- Ewald Moersen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of evaluating defects in a material transparent to electroma...
- Publication number 20110090492
- Publication date Apr 21, 2011
- Christian Lemke
- G01 - MEASURING TESTING
Information Patent Application
Method of determining local structures in optical crystals
- Publication number 20040021803
- Publication date Feb 5, 2004
- Ewald Moersen
- G01 - MEASURING TESTING