Christian Musshoff

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Villach, AT

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Patents Grantslast 30 patents

Information Patent Grant
Method for testing semiconductor dies
- Patent number 10,018,667
- Issue date Jul 10, 2018
- Infineon Technologies AG
- Erwin Thalmann
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing semiconductor dies and a test apparatus
- Patent number 9,435,849
- Issue date Sep 6, 2016
- Infineon Technologies AG
- Erwin Thalmann
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a contact region of a semiconductor module
- Patent number 7,265,564
- Issue date Sep 4, 2007
- Infineon Technologies AG
- Ralf Otremba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for Testing Semiconductor Dies
- Publication number 20160356839
- Publication date Dec 8, 2016
- INFINEON TECHNOLOGIES AG
- Erwin Thalmann
- G01 - MEASURING TESTING
Information Patent Application
Method for Testing Semiconductor Dies and a Test Apparatus
- Publication number 20150377954
- Publication date Dec 31, 2015
- INFINEON TECHNOLOGIES AG
- Erwin Thalmann
- G01 - MEASURING TESTING
Information Patent Application
Method for testing a contact region of a semiconductor module
- Publication number 20060066336
- Publication date Mar 30, 2006
- Ralf Otremba
- G01 - MEASURING TESTING