Christian Penzkofer

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Muenchen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Electron beam source and method of manufacturing the same
- Patent number 8,723,138
- Issue date May 13, 2014
- Carl Zeiss Microscopy GmbH
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing an SPM probe with a scanning tip and with a...
- Patent number 8,209,768
- Issue date Jun 26, 2012
- Nanoworld AG
- Thomas Sulzbach
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam source and method of manufacturing the same
- Patent number 8,164,071
- Issue date Apr 24, 2012
- Carl Zeiss NTS GmbH
- Volker Drexel
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20120131785
- Publication date May 31, 2012
- NANOTOOLS GMBH
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING AN SPM PROBE WITH A SCANNING TIP AND WITH A...
- Publication number 20100095409
- Publication date Apr 15, 2010
- NANOWORLD AG
- Thomas SULZBACH
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20100078557
- Publication date Apr 1, 2010
- CARL ZEISS NTS GMBH
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS