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Christian Rotsch
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Munchen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Mask set having separate masks to form different regions of integra...
Patent number
7,385,676
Issue date
Jun 10, 2008
Infineon Technologies AG
Christian Rotsch
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method for the formation of a structure size measured value
Patent number
7,307,715
Issue date
Dec 11, 2007
Infineon Technologies AG
Christian Rotsch
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method for communicating a measuring position of a structural eleme...
Patent number
7,124,379
Issue date
Oct 17, 2006
Infineon Technologies AG
Bettine Buechner
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method for determining the distance between periodic structures on...
Patent number
6,628,409
Issue date
Sep 30, 2003
Infineon Technologies AG
Christian Rotsch
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for combining scanning and imaging methods in che...
Patent number
6,552,331
Issue date
Apr 22, 2003
Infineon Technologies AG
Christian Rotsch
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method for the formation of a structure size measured value
Publication number
20050237542
Publication date
Oct 27, 2005
Christian Rotsch
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Photomask, and method for producing semiconductor devices
Publication number
20050003279
Publication date
Jan 6, 2005
Infineon Technologies AG
Christian Rotsch
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method for communicating a measuring position of a structural eleme...
Publication number
20040128643
Publication date
Jul 1, 2004
Bettine Buechner
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method for determining the distance between periodic structures on...
Publication number
20020149783
Publication date
Oct 17, 2002
Christian Rotsch
G01 - MEASURING TESTING
Information
Patent Application
Device and method for combining scanning and imaging methods in che...
Publication number
20020017621
Publication date
Feb 14, 2002
Christian Rotsch
B82 - NANO-TECHNOLOGY