Christian Scherner

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Hamburg, DE

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Patents Grantslast 30 patents

Information Patent Grant
Configurable built-in self-test for an all digital phase locked loop
- Patent number 11,218,153
- Issue date Jan 4, 2022
- NXP B.V.
- Ulrich Moehlmann
- G01 - MEASURING TESTING
Information Patent Grant
All digital phase locked loop (ADPLL) with frequency locked loop
- Patent number 10,826,505
- Issue date Nov 3, 2020
- NXP B.V.
- Ulrich Moehlmann
- H03 - BASIC ELECTRONIC CIRCUITRY