Christian Schmidt

Person

Epalinges, CH

People

Patents Grantslast 30 patents

Information Patent Grant
Sample positioning and analysis system
- Patent number 7,387,715
- Issue date Jun 17, 2008
- Molecular Devices Corporation
- Horst Vogel
- G01 - MEASURING TESTING
Information Patent Grant
Multiaperture sample positioning and analysis system
- Patent number 7,244,349
- Issue date Jul 17, 2007
- Molecular Devices Corporation
- Horst Vogel
- G01 - MEASURING TESTING
Information Patent Grant
Multiaperture sample positioning and analysis system
- Patent number 7,201,836
- Issue date Apr 10, 2007
- Molecular Devices Corporation
- Horst Vogel
- G01 - MEASURING TESTING
Information Patent Grant
Positioning and electrophysiological characterization of individual...
- Patent number 6,758,961
- Issue date Jul 6, 2004
- Ecole Polytechnique Federale de Lausanne
- Horst Vogel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTROTHERMAL FOCUSSING FOR THE PRODUCTION OF MICRO-STRUCTURED SUB...
- Publication number 20100276409
- Publication date Nov 4, 2010
- Christian Schmidt
- B26 - HAND CUTTING TOOLS CUTTING SEVERING
Information Patent Application
Multiaperture sample positioning and analysis system
- Publication number 20090153153
- Publication date Jun 18, 2009
- Horst Vogel
- G01 - MEASURING TESTING
Information Patent Application
Manufacturing and Use of Microperforated Substrates
- Publication number 20080047935
- Publication date Feb 28, 2008
- Christian Schmidt
- B26 - HAND CUTTING TOOLS CUTTING SEVERING
Information Patent Application
Multiaperture Sample Positioning and Analysis System
- Publication number 20070209935
- Publication date Sep 13, 2007
- Molecular Devices Corporation
- Horst VOGEL
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Multiaperture sample positioning and analysis system
- Publication number 20030146091
- Publication date Aug 7, 2003
- Horst Vogel
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Multiaperture sample positioning and analysis system
- Publication number 20030098248
- Publication date May 29, 2003
- Horst Vogel
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Multiaperture sample positioning and analysis system
- Publication number 20030052002
- Publication date Mar 20, 2003
- Horst Vogel
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Christian Schmidt

Person

Patents Grantslast 30 patents

Sample positioning and analysis system

Multiaperture sample positioning and analysis system

Multiaperture sample positioning and analysis system

Positioning and electrophysiological characterization of individual...

Patents Applicationslast 30 patents

ELECTROTHERMAL FOCUSSING FOR THE PRODUCTION OF MICRO-STRUCTURED SUB...

Multiaperture sample positioning and analysis system

Manufacturing and Use of Microperforated Substrates

Multiaperture Sample Positioning and Analysis System

Multiaperture sample positioning and analysis system

Multiaperture sample positioning and analysis system

Multiaperture sample positioning and analysis system