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Christian Weiss
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Essen, DE
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last 30 patents
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Patent Grant
Method for measuring the force interaction that is caused by a sample
Patent number
8,832,860
Issue date
Sep 9, 2014
Forschungszentrum Juelich GmbH
Ruslan Temirov
B82 - NANO-TECHNOLOGY
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last 30 patents
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Patent Application
METHOD FOR MEASURING THE FORCE INTERACTION THAT IS CAUSED BY A SAMPLE
Publication number
20120151638
Publication date
Jun 14, 2012
Ruslan Temirov
G01 - MEASURING TESTING