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Christian Wejdemann

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  • Roskilde, DK
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Patents Grantslast 30 patents

  • Information Patent Grant

    X-ray multigrain crystallography
    • Patent number 10,288,570
    • Issue date May 14, 2019
    • Xnovo Technology ApS
    • Christian Wejdemann
    • G01 - MEASURING TESTING
  • Information Patent Grant

    X-ray multigrain crystallography
    • Patent number 10,139,357
    • Issue date Nov 27, 2018
    • Xnovo Technology ApS
    • Christian Wejdemann
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    X-RAY MULTIGRAIN CRYSTALLOGRAPHY
    • Publication number 20190079032
    • Publication date Mar 14, 2019
    • Xnovo Technology ApS
    • Christian Wejdemann
    • G01 - MEASURING TESTING
  • Information Patent Application

    X-RAY MULTIGRAIN CRYSTALLOGRAPHY
    • Publication number 20170038317
    • Publication date Feb 9, 2017
    • Xnovo Technology ApS
    • Christian Wejdemann
    • G01 - MEASURING TESTING