Christie G. Enke

Person

Albuquerque, NM, US

People

Patents Grantslast 30 patents

Information Patent Grant
Detector system for targeted analysis by distance-of-flight mass sp...
- Patent number 11,127,580
- Issue date Sep 21, 2021
- UNM Rainforest Innovations
- Christie Enke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Combined distance-of-flight and time-of-flight mass spectrometer
- Patent number 8,648,295
- Issue date Feb 11, 2014
- Christie G. Enke
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Method for enhancement of mass resolution over a limited mass range...
- Patent number 8,604,423
- Issue date Dec 10, 2013
- Indiana University Research and Technology Corporation
- Christie G. Enke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhancement of concentration range of chromatographically detectabl...
- Patent number 8,378,296
- Issue date Feb 19, 2013
- STC.UNM
- Christie Enke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion focusing and detection in a miniature linear ion trap for mass...
- Patent number 7,960,692
- Issue date Jun 14, 2011
- STC.UNM
- Gareth S. Dobson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy focus for distance of flight mass spectometry with constant...
- Patent number 7,947,950
- Issue date May 24, 2011
- STC.UNM
- Christie G Enke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Distance of flight spectrometer for MS and simultaneous scanless MS/MS
- Patent number 7,429,728
- Issue date Sep 30, 2008
- STC.UNM
- Christie G. Enke
- G01 - MEASURING TESTING
Information Patent Grant
Distance of flight spectrometer for MS and simultaneous scanless MS/MS
- Patent number 7,041,968
- Issue date May 9, 2006
- Science & Technology Corporation @ UNM
- Christie G. Enke
- G01 - MEASURING TESTING
Information Patent Grant
Ion mirror
- Patent number 6,518,569
- Issue date Feb 11, 2003
- Science & Technology Corporation @ UNM
- Jun Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resistive stabilization of the electrospray ionization process
- Patent number 6,452,166
- Issue date Sep 17, 2002
- University of New Mexico
- Christie G. Enke
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Detector System for Targeted Analysis by Distance-of-Flight Mass Sp...
- Publication number 20200357624
- Publication date Nov 12, 2020
- STC.UNM
- Christie Enke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RESOLUTION AND MASS RANGE PERFORMANCE IN DISTANCE-OF-FLIGHT MASS SP...
- Publication number 20140138538
- Publication date May 22, 2014
- Battelle Memorial Institute
- Gary M. Hieftje
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMBINED DISTANCE-OF-FLIGHT AND TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20130092832
- Publication date Apr 18, 2013
- Battelle Memorial Institute
- Christie G. Enke
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
METHOD FOR ENHANCEMENT OF MASS RESOLUTION OVER A LIMITED MASS RANGE...
- Publication number 20130020482
- Publication date Jan 24, 2013
- Battelle Memorial Institute
- Christie G. Enke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Focusing and Detection in a Miniature Linear Ion Trap for Mass...
- Publication number 20100019143
- Publication date Jan 28, 2010
- Gareth S Dobson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Energy Focus for Distance of Flight Mass Spectometry with Constant...
- Publication number 20080017792
- Publication date Jan 24, 2008
- STC.UNM
- Christie G. Enke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Distance of flight spectrometer for MS & simultaneous scanless MS/MS
- Publication number 20060138318
- Publication date Jun 29, 2006
- Science & Technology Corporation @ UNM
- Christie G. Enke
- G01 - MEASURING TESTING
Information Patent Application
Distance of flight spectrometer for MS and simultaneous scanless MS/MS
- Publication number 20050040326
- Publication date Feb 24, 2005
- Science & Technology Corporation @ UNM
- Christie G. Enke
- G01 - MEASURING TESTING

Christie G. Enke

Person

Patents Grantslast 30 patents

Detector system for targeted analysis by distance-of-flight mass sp...

Combined distance-of-flight and time-of-flight mass spectrometer

Method for enhancement of mass resolution over a limited mass range...

Enhancement of concentration range of chromatographically detectabl...

Ion focusing and detection in a miniature linear ion trap for mass...

Energy focus for distance of flight mass spectometry with constant...

Distance of flight spectrometer for MS and simultaneous scanless MS/MS

Distance of flight spectrometer for MS and simultaneous scanless MS/MS

Ion mirror

Resistive stabilization of the electrospray ionization process

Patents Applicationslast 30 patents

Detector System for Targeted Analysis by Distance-of-Flight Mass Sp...

RESOLUTION AND MASS RANGE PERFORMANCE IN DISTANCE-OF-FLIGHT MASS SP...

COMBINED DISTANCE-OF-FLIGHT AND TIME-OF-FLIGHT MASS SPECTROMETER

METHOD FOR ENHANCEMENT OF MASS RESOLUTION OVER A LIMITED MASS RANGE...

Ion Focusing and Detection in a Miniature Linear Ion Trap for Mass...

Energy Focus for Distance of Flight Mass Spectometry with Constant...

Distance of flight spectrometer for MS & simultaneous scanless MS/MS

Distance of flight spectrometer for MS and simultaneous scanless MS/MS