Christinus Antoinetta Paulus Van Liempd

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
X-ray measurement apparatus for the measurement of x-ray doses and...
- Patent number 5,081,664
- Issue date Jan 14, 1992
- U.S. Philips Corporation
- Ging H. Lie
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optical signal receiving unti and apparatus for reproducing informa...
- Publication number 20050254828
- Publication date Nov 17, 2005
- Koninklike Philips Electronics N.C.
- Johannes Hubertus Antonius Brekelmans
- H04 - ELECTRIC COMMUNICATION TECHNIQUE