Christober RAYAPPAN

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Yongin-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method for detecting abnormal battery cell
- Patent number 12,188,989
- Issue date Jan 7, 2025
- Samsung SDI Co., Ltd.
- Jake Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for estimating state of health of battery
- Patent number 12,050,251
- Issue date Jul 30, 2024
- Samsung SDI Co., Ltd.
- Byeonghui Lim
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting internal short-circuited cell
- Patent number 11,846,683
- Issue date Dec 19, 2023
- Samsung SDI Co., Ltd.
- Jake Kim
- G01 - MEASURING TESTING
Information Patent Grant
Battery state estimation method
- Patent number 11,366,171
- Issue date Jun 21, 2022
- Samsung SDI Co., Ltd.
- Byeonghui Lim
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR ESTIMATING STATE OF CHARGE OF BATTERY
- Publication number 20230358810
- Publication date Nov 9, 2023
- Samsung SDI Co., Ltd.
- Christober Rayappan
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SIMULATION OF BATTERY PACK
- Publication number 20230176131
- Publication date Jun 8, 2023
- Samsung SDI Co., Ltd.
- Yongjun Hwang
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING INTERNAL SHORT-CIRCUITED CELL
- Publication number 20220268856
- Publication date Aug 25, 2022
- Samsung SDI Co., Ltd.
- Jake Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING ABNORMAL BATTERY CELL
- Publication number 20220196754
- Publication date Jun 23, 2022
- Samsung SDI Co., Ltd.
- Jake Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ESTIMATING STATE OF HEALTH OF BATTERY
- Publication number 20220082626
- Publication date Mar 17, 2022
- Samsung SDI Co., Ltd.
- Byeonghui Lim
- G01 - MEASURING TESTING
Information Patent Application
BATTERY STATE ESTIMATION METHOD
- Publication number 20210048480
- Publication date Feb 18, 2021
- Samsung SDI Co., Ltd.
- Byeonghui LIM
- G01 - MEASURING TESTING