Christof Riedesel

Person

Essingen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method of recording an image using a particle microscope
- Patent number 11,728,130
- Issue date Aug 15, 2023
- Carl Zeiss SMT GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detector equalization during the imaging of objects with...
- Patent number 11,645,740
- Issue date May 9, 2023
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam system
- Patent number 11,562,881
- Issue date Jan 24, 2023
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam particle beam system
- Patent number 11,239,054
- Issue date Feb 1, 2022
- Carl Zeiss MultiSEM GmbH
- Yanko Sarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system
- Patent number 11,164,715
- Issue date Nov 2, 2021
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam charged particle system
- Patent number 11,087,948
- Issue date Aug 10, 2021
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam particle beam system
- Patent number 10,854,423
- Issue date Dec 1, 2020
- Carl Zeiss MultiSEM GmbH
- Yanko Sarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system
- Patent number 10,811,215
- Issue date Oct 20, 2020
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam charged particle system
- Patent number 10,741,355
- Issue date Aug 11, 2020
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system
- Patent number 10,600,613
- Issue date Mar 24, 2020
- Carl Zeiss Microscopy GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system
- Patent number 10,147,582
- Issue date Dec 4, 2018
- Carl Zeiss Microscopy GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system and method for operating a particle optical unit
- Patent number 9,991,089
- Issue date Jun 5, 2018
- Carl Zeiss Microscopy GmbH
- Ingo Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system and method for operating a particle optical unit
- Patent number 9,799,485
- Issue date Oct 24, 2017
- Carl Zeiss Microscopy GmbH
- Ingo Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical systems and arrangements and particle-optical comp...
- Patent number 9,653,254
- Issue date May 16, 2017
- Carl Zeiss Microscopy GmbH
- Dirk Zeidler
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Particle beam system
- Patent number 9,552,957
- Issue date Jan 24, 2017
- Carl Zeiss Microscopy GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam particle microscope and method for operating same
- Patent number 9,536,702
- Issue date Jan 3, 2017
- Carl Zeiss Microscopy GmbH
- Uwe Lang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical systems and arrangements and particle-optical comp...
- Patent number 9,384,938
- Issue date Jul 5, 2016
- Carl Zeiss Microscopy GmbH
- Dirk Zeidler
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
MULTI-BEAM SYSTEM AND MULTI-BEAM GENERATING UNIT WITH REDUCED SENSI...
- Publication number 20240379322
- Publication date Nov 14, 2024
- Carl Zeiss MultiSEM GmbH
- Alexander Wertz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF GLOBAL AND LOCAL OPTIMIZATION OF IMAGING RESOLUTION IN A...
- Publication number 20240274398
- Publication date Aug 15, 2024
- Carl Zeiss MultiSEM GmbH
- Christof Riedesel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM CHARGED PARTICLE SYSTEM AND METHOD OF CONTROLLING THE WO...
- Publication number 20240079207
- Publication date Mar 7, 2024
- Carl Zeiss MultiSEM GmbH
- Michael Behnke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CERTAIN IMPROVEMENTS OF MULTI-BEAM GENERATING AND MULTI-BEAM DEFLEC...
- Publication number 20220392734
- Publication date Dec 8, 2022
- Carl Zeiss MultiSEM GmbH
- Yanko Sarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM DIGITAL SCAN AND IMAGE ACQUISITION
- Publication number 20220351936
- Publication date Nov 3, 2022
- Carl Zeiss MultiSEM GmbH
- Nicolas Kaufmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE PARTICLE BEAM MICROSCOPE AND ASSOCIATED METHOD WITH AN IMP...
- Publication number 20220246388
- Publication date Aug 4, 2022
- Carl Zeiss MultiSEM GmbH
- Nicole Rauwolf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System
- Publication number 20220108864
- Publication date Apr 7, 2022
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF RECORDING AN IMAGE USING A PARTICLE MICROSCOPE
- Publication number 20210296089
- Publication date Sep 23, 2021
- Carl Zeiss SMT GMBH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING SAME
- Publication number 20210217577
- Publication date Jul 15, 2021
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETECTOR EQUALIZATION DURING THE IMGAGING OF OBJECTS WIT...
- Publication number 20210192700
- Publication date Jun 24, 2021
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-BEAM PARTICLE BEAM SYSTEM
- Publication number 20210066037
- Publication date Mar 4, 2021
- Carl Zeiss MultiSEM GmbH
- Yanko Sarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM
- Publication number 20200411274
- Publication date Dec 31, 2020
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM CHARGED PARTICLE SYSTEM
- Publication number 20200357600
- Publication date Nov 12, 2020
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM CHARGED PARTICLE SYSTEM
- Publication number 20200251301
- Publication date Aug 6, 2020
- CARL ZEISS MICROSCOPY GMBH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM
- Publication number 20190355545
- Publication date Nov 21, 2019
- CARL ZEISS MICROSCOPY GMBH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM PARTICLE BEAM SYSTEM
- Publication number 20190259575
- Publication date Aug 22, 2019
- CARL ZEISS MICROSCOPY GMBH
- Yanko Sarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM
- Publication number 20190088440
- Publication date Mar 21, 2019
- CARL ZEISS MICROSCOPY GMBH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING A PARTICLE OPTICAL UNIT
- Publication number 20180040454
- Publication date Feb 8, 2018
- CARL ZEISS MICROSCOPY GMBH
- Ingo Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM
- Publication number 20170133194
- Publication date May 11, 2017
- CARL ZEISS MICROSCOPY GMBH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle-Optical Systems and Arrangements and Particle-Optical Comp...
- Publication number 20160155603
- Publication date Jun 2, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING A PARTICLE OPTICAL UNIT
- Publication number 20150357157
- Publication date Dec 10, 2015
- CARL ZEISS MICROSCOPY GMBH
- Ingo Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM
- Publication number 20150348738
- Publication date Dec 3, 2015
- Car Zeiss Microscopy GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM PARTICLE MICROSCOPE AND METHOD FOR OPERATING SAME
- Publication number 20150348749
- Publication date Dec 3, 2015
- CARL ZEISS MICROSCOPY GMBH
- Uwe Lang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle-Optical Systems and Arrangements and Particle-Optical Comp...
- Publication number 20130187046
- Publication date Jul 25, 2013
- Carl Zeiss SMT GMBH
- Dirk Zeidler
- B82 - NANO-TECHNOLOGY

Christof Riedesel

Person

Patents Grantslast 30 patents

Method of recording an image using a particle microscope

Method for detector equalization during the imaging of objects with...

Charged particle beam system

Multi-beam particle beam system

Charged particle beam system

Multi-beam charged particle system

Multi-beam particle beam system

Charged particle beam system

Multi-beam charged particle system

Particle beam system

Particle beam system

Particle beam system and method for operating a particle optical unit

Particle beam system and method for operating a particle optical unit

Particle-optical systems and arrangements and particle-optical comp...

Particle beam system

Multi-beam particle microscope and method for operating same

Particle-optical systems and arrangements and particle-optical comp...

Patents Applicationslast 30 patents

MULTI-BEAM SYSTEM AND MULTI-BEAM GENERATING UNIT WITH REDUCED SENSI...

METHOD OF GLOBAL AND LOCAL OPTIMIZATION OF IMAGING RESOLUTION IN A...

MULTI-BEAM CHARGED PARTICLE SYSTEM AND METHOD OF CONTROLLING THE WO...

CERTAIN IMPROVEMENTS OF MULTI-BEAM GENERATING AND MULTI-BEAM DEFLEC...

MULTI-BEAM DIGITAL SCAN AND IMAGE ACQUISITION

MULTIPLE PARTICLE BEAM MICROSCOPE AND ASSOCIATED METHOD WITH AN IMP...

Charged Particle Beam System

METHOD OF RECORDING AN IMAGE USING A PARTICLE MICROSCOPE

MULTI-BEAM PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING SAME

METHOD FOR DETECTOR EQUALIZATION DURING THE IMGAGING OF OBJECTS WIT...

MULTI-BEAM PARTICLE BEAM SYSTEM

CHARGED PARTICLE BEAM SYSTEM

MULTI-BEAM CHARGED PARTICLE SYSTEM

MULTI-BEAM CHARGED PARTICLE SYSTEM

CHARGED PARTICLE BEAM SYSTEM

MULTI-BEAM PARTICLE BEAM SYSTEM

PARTICLE BEAM SYSTEM

PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING A PARTICLE OPTICAL UNIT

PARTICLE BEAM SYSTEM

Particle-Optical Systems and Arrangements and Particle-Optical Comp...

PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING A PARTICLE OPTICAL UNIT

PARTICLE BEAM SYSTEM

MULTI-BEAM PARTICLE MICROSCOPE AND METHOD FOR OPERATING SAME

Particle-Optical Systems and Arrangements and Particle-Optical Comp...