Christoph Dietz

Person

Obertshausen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Distance measuring device
- Patent number 11,460,577
- Issue date Oct 4, 2022
- Precitec Optronik GmbH
- Christoph Dietz
- B24 - GRINDING POLISHING
Information Patent Grant
Method and device for measuring the depth of the vapor capillary du...
- Patent number 11,027,364
- Issue date Jun 8, 2021
- PRECITEC OPTRONIK GMBH
- Martin Schönleber
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for determining the position and/or the orient...
- Patent number 10,762,348
- Issue date Sep 1, 2020
- Precitec Optronik GmbH
- Gabriel Palzer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical measuring device
- Patent number 10,725,178
- Issue date Jul 28, 2020
- Precitec Optronik Gmbh
- Christoph Dietz
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for the controlled machining of a workpiece
- Patent number 10,695,863
- Issue date Jun 30, 2020
- Precitec Optronik Gmbh
- Christoph Dietz
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Optical measuring device
- Patent number 10,466,357
- Issue date Nov 5, 2019
- Precitec Optronik Gmbh
- Christoph Dietz
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for optically measuring a measurement object
- Patent number 10,228,551
- Issue date Mar 12, 2019
- Precitec Optronik GmbH
- Christoph Dietz
- G02 - OPTICS
Information Patent Grant
Apparatus and method for monitoring a thickness of a silicon wafer...
- Patent number 9,230,817
- Issue date Jan 5, 2016
- Precitec Optronik GmbH
- Martin Schoenleber
- B24 - GRINDING POLISHING
Information Patent Grant
Monitoring apparatus and method for in-situ measurement of wafer th...
- Patent number 8,716,039
- Issue date May 6, 2014
- Precitec Optronik GmbH
- Claus Dusemund
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for monitoring a thickness of a silicon wafer...
- Patent number 8,699,038
- Issue date Apr 15, 2014
- Precitec Optronik GmbH
- Martin Schoenleber
- B24 - GRINDING POLISHING
Information Patent Grant
Machining device and method for machining material
- Patent number 8,410,392
- Issue date Apr 2, 2013
- Precitec Optronik GmbH
- Markus Kogel-Hollacher
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of welding workpieces and apparatus for carrying it out
- Patent number 6,084,223
- Issue date Jul 4, 2000
- Jurca Optoelektronik
- Christoph Dietz
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR MEASURING OPTICAL THICKNESS
- Publication number 20240377186
- Publication date Nov 14, 2024
- PRECITEC OPTRONIK GMBH
- Stephan Weiß
- G01 - MEASURING TESTING
Information Patent Application
CHROMATIC CONFOCAL MEASURING SYSTEM FOR HIGH-SPEED DISTANCE MEASURE...
- Publication number 20240167808
- Publication date May 23, 2024
- PRECITEC OPTRONIK GMBH
- Stephan Weiß
- G01 - MEASURING TESTING
Information Patent Application
CHROMATIC CONFOCAL MEASURING DEVICE
- Publication number 20230417533
- Publication date Dec 28, 2023
- PRECITEC OPTRONIK GMBH
- Christoph Dietz
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE
- Publication number 20200174127
- Publication date Jun 4, 2020
- PRECITEC OPTRONIK GMBH
- Christoph Dietz
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASURING DEVICE
- Publication number 20190137626
- Publication date May 9, 2019
- PRECITEC OPTRONIK GMBH
- Christoph Dietz
- B24 - GRINDING POLISHING
Information Patent Application
METHOD AND DEVICE FOR MEASURING THE DEPTH OF THE VAPOR CAPILLARY DU...
- Publication number 20190091798
- Publication date Mar 28, 2019
- PRECITEC OPTRONIK GMBH
- Martin Schönleber
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING THE POSITION AND/OR THE ORIENT...
- Publication number 20180189563
- Publication date Jul 5, 2018
- PRECITEC OPTRONIK GMBH
- Gabriel PALZER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and Method for Monitoring a Thickness of a Silicon Wafer...
- Publication number 20140315333
- Publication date Oct 23, 2014
- PRECITEC OPTRONIK GMBH
- Martin Schoenleber
- G01 - MEASURING TESTING
Information Patent Application
MONITORING APPARATUS AND METHOD FOR IN-SITU MEASUREMENT OF WAFER TH...
- Publication number 20130034918
- Publication date Feb 7, 2013
- DUSEMUND PTE. LTD
- Claus Dusemund
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Monitoring a Thickness of a Silicon Wafer...
- Publication number 20110261371
- Publication date Oct 27, 2011
- PRECITEC OPTRONIK GMBH
- Martin Schoenleber
- B24 - GRINDING POLISHING
Information Patent Application
Machining Device and Method for Machining Material
- Publication number 20100155375
- Publication date Jun 24, 2010
- Christoph Dietz
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Device and method for the contactless measurement of at least one c...
- Publication number 20070242279
- Publication date Oct 18, 2007
- Berthold Michelt
- G01 - MEASURING TESTING

Christoph Dietz

Person

Patents Grantslast 30 patents

Distance measuring device

Method and device for measuring the depth of the vapor capillary du...

Method and apparatus for determining the position and/or the orient...

Optical measuring device

Method and device for the controlled machining of a workpiece

Optical measuring device

Device and method for optically measuring a measurement object

Apparatus and method for monitoring a thickness of a silicon wafer...

Monitoring apparatus and method for in-situ measurement of wafer th...

Apparatus and method for monitoring a thickness of a silicon wafer...

Machining device and method for machining material

Method of welding workpieces and apparatus for carrying it out

Patents Applicationslast 30 patents

METHOD AND DEVICE FOR MEASURING OPTICAL THICKNESS

CHROMATIC CONFOCAL MEASURING SYSTEM FOR HIGH-SPEED DISTANCE MEASURE...

CHROMATIC CONFOCAL MEASURING DEVICE

OPTICAL MEASURING DEVICE

DISTANCE MEASURING DEVICE

METHOD AND DEVICE FOR MEASURING THE DEPTH OF THE VAPOR CAPILLARY DU...

METHOD AND APPARATUS FOR DETERMINING THE POSITION AND/OR THE ORIENT...

Apparatus and Method for Monitoring a Thickness of a Silicon Wafer...

MONITORING APPARATUS AND METHOD FOR IN-SITU MEASUREMENT OF WAFER TH...

Apparatus and Method for Monitoring a Thickness of a Silicon Wafer...

Machining Device and Method for Machining Material

Device and method for the contactless measurement of at least one c...