Christoph Ollinger

Person

Karlsruhe, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for the detection and correction of lens distortions in an e...
- Patent number 12,078,603
- Issue date Sep 3, 2024
- Joerg Kaercher
- G01 - MEASURING TESTING
Information Patent Grant
Stimulated X-ray emission source with crystalline resonance cavity
- Patent number 11,031,745
- Issue date Jun 8, 2021
- Roger D. Durst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stimulated X-ray emission source with crystalline resonance cavity
- Patent number 10,998,693
- Issue date May 4, 2021
- Roger D. Durst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron diffraction imaging system for determining molecular struc...
- Patent number 10,784,078
- Issue date Sep 22, 2020
- Roger D. Durst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray source using electron impact excitation of high velocity liqu...
- Patent number 10,473,599
- Issue date Nov 12, 2019
- Roger D. Durst
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray apparatus with deflectable electron beam
- Patent number 10,049,850
- Issue date Aug 14, 2018
- Bruker Axs GmbH
- Christoph Ollinger
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for collecting accurate X-ray diffraction data with a scanni...
- Patent number 9,897,559
- Issue date Feb 20, 2018
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Grant
X-ray optical configuration with two focusing elements
- Patent number 8,345,822
- Issue date Jan 1, 2013
- Bruker Axs GmbH
- Christoph Ollinger
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray optical element and diffractometer with a soller slit
- Patent number 7,983,389
- Issue date Jul 19, 2011
- Bruker Axs GmbH
- Christoph Ollinger
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR THE DETECTION AND CORRECTION OF LENS DISTORTIONS IN AN E...
- Publication number 20220317068
- Publication date Oct 6, 2022
- Bruker AXS, LLC
- Joerg KAERCHER
- G01 - MEASURING TESTING
Information Patent Application
GRAPHENE ENCAPSULATION OF BIOLOGICAL MOLECULES FOR SINGLE MOLECULE...
- Publication number 20220163431
- Publication date May 26, 2022
- Bruker AXS GmbH
- Christoph OLLINGER
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON DIFFRACTION IMAGING SYSTEM FOR DETERMINING MOLECULAR STRUC...
- Publication number 20200135424
- Publication date Apr 30, 2020
- Bruker AXS GmbH
- Roger D. DURST
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY SOURCE USING ELECTRON IMPACT EXCITATION OF HIGH VELOCITY LIQU...
- Publication number 20190170670
- Publication date Jun 6, 2019
- Bruker AXS GmbH
- Roger D. DURST
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR COLLECTING ACCURATE X-RAY DIFFRACTION DATA WITH A SCANNI...
- Publication number 20170176355
- Publication date Jun 22, 2017
- Bruker AXS, Inc.
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Application
X-ray apparatus with deflectable electron beam
- Publication number 20150380202
- Publication date Dec 31, 2015
- Bruker AXS GmbH
- Christoph Ollinger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-ray optical configuration with two focusing elements
- Publication number 20110135059
- Publication date Jun 9, 2011
- Bruker AXS GmbH
- Christoph Ollinger
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-ray optical element and diffractometer with a soller slit
- Publication number 20100135460
- Publication date Jun 3, 2010
- Bruker AXS GmbH
- Christoph Ollinger
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Christoph Ollinger

Person

Patents Grantslast 30 patents

Method for the detection and correction of lens distortions in an e...

Stimulated X-ray emission source with crystalline resonance cavity

Stimulated X-ray emission source with crystalline resonance cavity

Electron diffraction imaging system for determining molecular struc...

X-ray source using electron impact excitation of high velocity liqu...

X-ray apparatus with deflectable electron beam

Method for collecting accurate X-ray diffraction data with a scanni...

X-ray optical configuration with two focusing elements

X-ray optical element and diffractometer with a soller slit

Patents Applicationslast 30 patents

METHOD FOR THE DETECTION AND CORRECTION OF LENS DISTORTIONS IN AN E...

GRAPHENE ENCAPSULATION OF BIOLOGICAL MOLECULES FOR SINGLE MOLECULE...

ELECTRON DIFFRACTION IMAGING SYSTEM FOR DETERMINING MOLECULAR STRUC...

X-RAY SOURCE USING ELECTRON IMPACT EXCITATION OF HIGH VELOCITY LIQU...

METHOD FOR COLLECTING ACCURATE X-RAY DIFFRACTION DATA WITH A SCANNI...

X-ray apparatus with deflectable electron beam

X-ray optical configuration with two focusing elements

X-ray optical element and diffractometer with a soller slit