Springfield, VA, US
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Patent Grant
The Government of the United States of America, as represented by the Secreta...
Andrew Nicholas
G01 - MEASURING TESTING
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Patent Grant
The United States of America, as represented by the Secretary of the Navy
Christoph R. Englert
G02 - OPTICS
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Patent Grant
The United States of America, as represented by the Secretary of the Navy
Christoph R. Englert
G01 - MEASURING TESTING
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Patent Grant
Robert R. Meier
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the Secretary of the Navy
John M Harlander
G01 - MEASURING TESTING
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Patent Grant
The United States of America as represented by the Secretary of the Navy
Christoph R Englert
G01 - MEASURING TESTING
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Patent Application
The Government of the United States of America, as represented by the Secreta...
Andrew Nicholas
G01 - MEASURING TESTING
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Patent Application
CHRISTOPH R. ENGLERT
G01 - MEASURING TESTING
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Patent Application
US Gov't Represented by the Secretary of the Navy Office of Naval Research (O...
Christoph R. Englert
G01 - MEASURING TESTING
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Patent Application
GOVERNMENT OF THE UNITED STATES REPRESENTED BY THE SECRETARY OF THE NAVY CODE
Robert R. Meier
G01 - MEASURING TESTING
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Patent Application
John M. Harlander
G01 - MEASURING TESTING
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Patent Application
John M. Harlander
G01 - MEASURING TESTING
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Patent Application
Christoph R. Englert
G01 - MEASURING TESTING
