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Christoph Striebel
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Dornstadt, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Measuring system
Patent number
9,482,968
Issue date
Nov 1, 2016
Carl Zeiss SMT GmbH
Markus Goeppert
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Process for determining the temperature of a semiconductor wafer in...
Patent number
7,412,299
Issue date
Aug 12, 2008
Mattson Thermal Products GmbH
Markus Hauf
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for thermally treating substrates
Patent number
7,316,969
Issue date
Jan 8, 2008
Mattson Technology, Inc.
Markus Hauf
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Method and device for thermal treatment of substrates
Patent number
7,056,389
Issue date
Jun 6, 2006
Mattson Thermal Products
Markus Hauf
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Patents Applications
last 30 patents
Information
Patent Application
MEASURING SYSTEM
Publication number
20140118712
Publication date
May 1, 2014
Carl Zeiss SMT GMBH
Markus GOEPPERT
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for thermally treating substrates
Publication number
20060291834
Publication date
Dec 28, 2006
Markus Hauf
C30 - CRYSTAL GROWTH
Information
Patent Application
Process for determining the temperature of a semiconductor wafer in...
Publication number
20060100735
Publication date
May 11, 2006
Markus Hauf
G01 - MEASURING TESTING
Information
Patent Application
Method and device for thermal treatment of substrates
Publication number
20040185680
Publication date
Sep 23, 2004
Markus Hauf
C30 - CRYSTAL GROWTH