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Christoph T. KOCH
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Goeppingen, DE
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last 30 patents
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Patent Grant
Method and device for measuring electron diffraction of a sample
Patent number
8,076,640
Issue date
Dec 13, 2011
Max-Planck Gesellschaft zur Foerderung der Wissenschaften e.V.
Christoph T Koch
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD AND DEVICE FOR MEASURING ELECTRON DIFFRACTION OF A SAMPLE
Publication number
20110049363
Publication date
Mar 3, 2011
Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.v
Christoph T. KOCH
G01 - MEASURING TESTING