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Christophe David FOUQUET

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Patents Grantslast 30 patents

  • Information Patent Grant

    Computational wafer inspection
    • Patent number 12,067,340
    • Issue date Aug 20, 2024
    • ASML Netherlands B.V.
    • Christophe David Fouquet
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Metrology method, target and substrate
    • Patent number 11,428,521
    • Issue date Aug 30, 2022
    • ASML Netherlands B.V.
    • Kaustuve Bhattacharyya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Metrology method, target and substrate
    • Patent number 11,204,239
    • Issue date Dec 21, 2021
    • ASML Netherlands B.V.
    • Kaustuve Bhattacharyya
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Grant

    Computational wafer inspection
    • Patent number 11,080,459
    • Issue date Aug 3, 2021
    • ASML Netherlands B.V.
    • Christophe David Fouquet
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Metrology method, target and substrate
    • Patent number 10,718,604
    • Issue date Jul 21, 2020
    • ASML Netherlands B.V.
    • Kaustuve Bhattacharyya
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Grant

    Computational wafer inspection
    • Patent number 10,579,772
    • Issue date Mar 3, 2020
    • ASML Netherlands B.V.
    • Christophe David Fouquet
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Metrology method, target and substrate
    • Patent number 10,386,176
    • Issue date Aug 20, 2019
    • ASML Netherlands B.V.
    • Kaustuve Bhattacharyya
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Grant

    Computational wafer inspection
    • Patent number 9,990,462
    • Issue date Jun 5, 2018
    • ASML Netherlands B.V.
    • Christophe David Fouquet
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Grant

    Computational wafer inspection
    • Patent number 9,507,907
    • Issue date Nov 29, 2016
    • ASML Netherlands B.V.
    • Christophe David Fouquet
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

  • Information Patent Application

    COMPUTATIONAL WAFER INSPECTION
    • Publication number 20240403537
    • Publication date Dec 5, 2024
    • ASML NETHERLANDS B.V.
    • Christophe David FOUQUET
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    METROLOGY METHOD, TARGET AND SUBSTRATE
    • Publication number 20230016664
    • Publication date Jan 19, 2023
    • ASML NETHERLANDS B.V.
    • Kaustuve BHATTACHARYYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    METROLOGY METHOD, TARGET AND SUBSTRATE
    • Publication number 20220057192
    • Publication date Feb 24, 2022
    • ASML NETHERLANDS B.V.
    • Kaustuve BHATTACHARYYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    COMPUTATIONAL WAFER INSPECTION
    • Publication number 20210357570
    • Publication date Nov 18, 2021
    • ASML NETHERLANDS B.V.
    • Christophe David FOUQUET
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    METROLOGY METHOD, TARGET AND SUBSTRATE
    • Publication number 20200348125
    • Publication date Nov 5, 2020
    • ASML NETHERLANDS B.V.
    • Kaustuve BHATTACHARYYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    COMPUTATIONAL WAFER INSPECTION
    • Publication number 20200218849
    • Publication date Jul 9, 2020
    • ASML NETHERLANDS B.V.
    • Christophe David FOUQUET
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    COMPUTATIONAL WAFER INSPECTION
    • Publication number 20180365369
    • Publication date Dec 20, 2018
    • ASML NETHERLANDS B.V.
    • Christophe David FOUQUET
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    COMPUTATIONAL WAFER INSPECTION
    • Publication number 20170046473
    • Publication date Feb 16, 2017
    • ASML NETHERLANDS B.V.
    • Christophe David FOUQUET
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    METROLOGY METHOD, TARGET AND SUBSTRATE
    • Publication number 20160061589
    • Publication date Mar 3, 2016
    • ASML NETHERLANDS B.V.
    • Kaustuve BHATTACHARYYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    COMPUTATIONAL WAFER INSPECTION
    • Publication number 20150356233
    • Publication date Dec 10, 2015
    • ASML NETHERLANDS B.V.
    • Christophe David FOUQUET
    • G06 - COMPUTING CALCULATING COUNTING