Christophe Fouquet

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for detecting design and process defects on a waf...
- Patent number 9,710,903
- Issue date Jul 18, 2017
- KLA-Tencor Corp.
- Christophe Fouquet
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Use of design information and defect image information in defect cl...
- Patent number 8,175,373
- Issue date May 8, 2012
- KLA-Tencor Corporation
- Gordon Abbott
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining locations on a wafer to be reviewed during defect review
- Patent number 7,904,845
- Issue date Mar 8, 2011
- KLA-Tencor Corp.
- Christophe Fouquet
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods, defect review tools, and systems for locating a defect in...
- Patent number 7,747,062
- Issue date Jun 29, 2010
- KLA-Tencor Technologies Corp.
- Da Chen
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR DETECTING DESIGN AND PROCESS DEFECTS ON A W...
- Publication number 20110276935
- Publication date Nov 10, 2011
- KLA-Tencor Corporation
- Christophe Fouquet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
USE OF DESIGN INFORMATION AND DEFECT IMAGE INFORMATION IN DEFECT CL...
- Publication number 20100208979
- Publication date Aug 19, 2010
- KLA-Tencor Corporation
- Gordon Abbott
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS, DESIGNS, DEFECT REVIEW TOOLS, AND SYSTEMS FOR DETERMINING...
- Publication number 20080163140
- Publication date Jul 3, 2008
- Christophe Fouquet
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods, defect review tools, and systems for locating a defect in...
- Publication number 20080032429
- Publication date Feb 7, 2008
- Da Chen
- G06 - COMPUTING CALCULATING COUNTING