Christopher A. Goeden

Person

Lincoln, NE, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for investigating change in optical properties of...
- Patent number 9,546,943
- Issue date Jan 17, 2017
- J. A. Woollam Co., Inc.
- Jeremy A. Vanderslice
- G01 - MEASURING TESTING
Information Patent Grant
System and method of controlling intensity of an electromagnetic beam
- Patent number 7,796,260
- Issue date Sep 14, 2010
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Automated ellipsometer and the like systems
- Patent number 7,746,472
- Issue date Jun 29, 2010
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Flying mobile on-board ellipsometer, polarimeter, reflectometer and...
- Patent number 7,746,471
- Issue date Jun 29, 2010
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Sample orientation system and method
- Patent number 7,619,752
- Issue date Nov 17, 2009
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Beam chromatic shifting and directing means
- Patent number 7,535,566
- Issue date May 19, 2009
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
System for and method of investigating the exact same point on a sa...
- Patent number 7,522,279
- Issue date Apr 21, 2009
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
System for and method of investigating the exact same point on a sa...
- Patent number 7,508,510
- Issue date Mar 24, 2009
- J.A. Wooliam Co., Inc.
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Grant
Automated ellipsometer and the like systems
- Patent number 7,505,134
- Issue date Mar 17, 2009
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Control of uncertain angle of incidence of beam from Arc lamp
- Patent number 7,301,631
- Issue date Nov 27, 2007
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Flying mobile on-board ellipsometer, polarimeter, reflectometer and...
- Patent number 7,277,171
- Issue date Oct 2, 2007
- J.A. Woollan Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Method of calibrating effects of multi-AOI-system for easy changing...
- Patent number 7,265,838
- Issue date Sep 4, 2007
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
System and method for setting and compensating errors in AOI and PO...
- Patent number 7,136,172
- Issue date Nov 14, 2006
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometer or polarimeter and the like system with beam chromatic...
- Patent number 7,099,006
- Issue date Aug 29, 2006
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
System for and method of investigating the exact same point on a sa...
- Patent number 7,057,717
- Issue date Jun 6, 2006
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Multi-AOI-system for easy changing angles-of-incidence in ellipsome...
- Patent number 6,859,278
- Issue date Feb 22, 2005
- J. A. Woollam Co. Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Sample orientation system and method
- Publication number 20080117413
- Publication date May 22, 2008
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
System for and method of investigating the exact same point on a sa...
- Publication number 20070097373
- Publication date May 3, 2007
- Galen L. Pfeiffer
- G01 - MEASURING TESTING

Christopher A. Goeden

Person

Patents Grantslast 30 patents

System and method for investigating change in optical properties of...

System and method of controlling intensity of an electromagnetic beam

Automated ellipsometer and the like systems

Flying mobile on-board ellipsometer, polarimeter, reflectometer and...

Sample orientation system and method

Beam chromatic shifting and directing means

System for and method of investigating the exact same point on a sa...

System for and method of investigating the exact same point on a sa...

Automated ellipsometer and the like systems

Control of uncertain angle of incidence of beam from Arc lamp

Flying mobile on-board ellipsometer, polarimeter, reflectometer and...

Method of calibrating effects of multi-AOI-system for easy changing...

System and method for setting and compensating errors in AOI and PO...

Ellipsometer or polarimeter and the like system with beam chromatic...

System for and method of investigating the exact same point on a sa...

Multi-AOI-system for easy changing angles-of-incidence in ellipsome...

Patents Applicationslast 30 patents

Sample orientation system and method

System for and method of investigating the exact same point on a sa...