TREA

Christopher B. Lesher

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  • Gilbert, AZ, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Wafer-level gate stress testing
    • Patent number 9,322,870
    • Issue date Apr 26, 2016
    • FREESCALE SEMICONDUCTOR, INC.
    • William E. Edwards
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    WAFER-LEVEL GATE STRESS TESTING
    • Publication number 20150067429
    • Publication date Mar 5, 2015
    • FREESCALE SEMICONDUCTOR, INC.
    • William E. Edwards
    • G01 - MEASURING TESTING