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Christopher Barr
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Plano, TX, US
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last 30 patents
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Patent Grant
On-chip spectral analysis using enhanced recursive discrete Fourier...
Patent number
9,342,482
Issue date
May 17, 2016
Texas Instruments Incorporated
Joonsung Park
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
ON-CHIP SPECTRAL ANALYSIS USING ENHANCED RECURSIVE DISCRETE FOURIER...
Publication number
20140136138
Publication date
May 15, 2014
Texas Instruments, Incorporated
Joonsung Park
G01 - MEASURING TESTING