Christopher C. Nunes

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White Plains, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Through-the-lens alignment for photolithography
- Patent number 6,664,012
- Issue date Dec 16, 2003
- Anvik Corporation
- Christopher C. Nunes
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Through-the-lens alignment for photolithography
- Publication number 20030211409
- Publication date Nov 13, 2003
- Christopher C. Nunes
- G01 - MEASURING TESTING