Christopher Coleman

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Woking, GB

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Patents Grantslast 30 patents

Information Patent Grant
On-chip circuit for transition delay fault test pattern generation...
- Patent number 7,640,461
- Issue date Dec 29, 2009
- LSI Logic Corporation
- Thai-Minh Nguyen
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
ON-CHIP CIRCUIT FOR TRANSITION DELAY FAULT TEST PATTERN GENERATION...
- Publication number 20090125769
- Publication date May 14, 2009
- Thai-Minh Nguyen
- G01 - MEASURING TESTING