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Christopher David Pylant
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Carrollton, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
System, apparatus, and method for improved background correction an...
Patent number
12,174,071
Issue date
Dec 24, 2024
Verity Instruments, Inc.
John Corless
G01 - MEASURING TESTING
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Patent Grant
System, apparatus, and method for spectral filtering
Patent number
11,885,682
Issue date
Jan 30, 2024
Verity Instruments, Inc.
Chris D. Pylant
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
CONTROL FOR SEMICONDUCTOR PROCESSING SYSTEMS
Publication number
20240021450
Publication date
Jan 18, 2024
Verity Instruments, Inc.
Chris Pylant
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM, APPARATUS, AND METHOD FOR IMPROVED BACKGROUND CORRECTION AN...
Publication number
20230366736
Publication date
Nov 16, 2023
Verity Instruments, Inc.
John Corless
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM, APPARATUS, AND METHOD FOR SPECTRAL FILTERING
Publication number
20230194342
Publication date
Jun 22, 2023
Verity Instruments, Inc.
Chris D. Pylant
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and Apparatus for Monitoring Pulsed Plasma Processes
Publication number
20160131587
Publication date
May 12, 2016
Verity Instruments, Inc.
Mark Anthony Meloni
G01 - MEASURING TESTING