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Christopher G. Regier
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Cedar Park, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Self-calibration of source-measure unit via capacitor
Patent number
10,436,874
Issue date
Oct 8, 2019
National Instruments Corporation
Christopher G. Regier
G01 - MEASURING TESTING
Information
Patent Grant
Digitally compensating for the impact of input bias current on curr...
Patent number
10,338,110
Issue date
Jul 2, 2019
National Instruments Corporation
Pablo E. Limon-Garcia-Viesca
G01 - MEASURING TESTING
Information
Patent Grant
Self-calibration of source-measure unit via capacitor
Patent number
10,175,334
Issue date
Jan 8, 2019
National Instruments Corporation
Christopher G. Regier
G01 - MEASURING TESTING
Information
Patent Grant
Single-junction voltage reference
Patent number
10,120,405
Issue date
Nov 6, 2018
National Instruments Corporation
Christopher G. Regier
G05 - CONTROLLING REGULATING
Information
Patent Grant
Digital approach to the removal of AC parasitics for impedance meas...
Patent number
9,910,074
Issue date
Mar 6, 2018
National Instruments Corporation
Blake A. Lindell
G01 - MEASURING TESTING
Information
Patent Grant
Efficient low noise high speed amplifier
Patent number
9,294,057
Issue date
Mar 22, 2016
National Instruments Corporation
Christopher G. Regier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Compensation methods for digital source-measure-units (SMUs)
Patent number
8,797,025
Issue date
Aug 5, 2014
National Instruments Corporation
Christopher G. Regier
G01 - MEASURING TESTING
Information
Patent Grant
Fast current saturation recovery for a digital source measure unit...
Patent number
8,653,840
Issue date
Feb 18, 2014
National Instruments Corporation
Christopher G. Regier
G01 - MEASURING TESTING
Information
Patent Grant
Resistance simulation and common mode rejection for digital source-...
Patent number
8,604,765
Issue date
Dec 10, 2013
National Instruments Corporation
Christopher G. Regier
G01 - MEASURING TESTING
Information
Patent Grant
Compliance methods for source measure units operating with digital...
Patent number
8,456,338
Issue date
Jun 4, 2013
National Instruments Corporation
Christopher G. Regier
G01 - MEASURING TESTING
Information
Patent Grant
Source-measure unit based on digital control loop
Patent number
7,903,008
Issue date
Mar 8, 2011
National Instruments Corporation
Christopher G. Regier
G01 - MEASURING TESTING
Information
Patent Grant
AC amplifier for precision measurement
Patent number
7,423,480
Issue date
Sep 9, 2008
National Instruments Corporation
Christopher G. Regier
G01 - MEASURING TESTING
Information
Patent Grant
Differential filter topology with dielectric absorption cancellatio...
Patent number
7,339,418
Issue date
Mar 4, 2008
National Instruments Corporation
Christopher G. Regier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Differential structure programmable gain instrumentation amplifier
Patent number
7,327,189
Issue date
Feb 5, 2008
National Instruments Corporation
Christopher G. Regier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Programmable gain instrumentation amplifier with improved gain mult...
Patent number
7,215,197
Issue date
May 8, 2007
National Instruments Corporation
Christopher G. Regier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Programmable gain instrumentation amplifier including a composite a...
Patent number
7,183,854
Issue date
Feb 27, 2007
National Instruments Corporation
Christopher G. Regier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Calibrating analog-to-digital systems using a precision reference a...
Patent number
7,146,283
Issue date
Dec 5, 2006
National Instruments Corporation
Clayton H. Daigle
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Programmable gain instrumentation amplifier having improved dielect...
Patent number
7,095,280
Issue date
Aug 22, 2006
National Instruments Corporation
Christopher G. Regier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Scanning front end using single-pole, double-throw switches to redu...
Patent number
7,042,376
Issue date
May 9, 2006
National Instruments Corporation
Christopher G. Regier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Fast and accurate AC RMS and DC measurement
Patent number
7,016,796
Issue date
Mar 21, 2006
National Instruments Corporation
Bakul Damle
G01 - MEASURING TESTING
Information
Patent Grant
High-speed high-resolution ADC for precision measurements
Patent number
6,970,118
Issue date
Nov 29, 2005
National Instruments Corporation
Christopher G. Regier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method for correcting analog-to-digital converter (ADC) errors, and...
Patent number
6,323,792
Issue date
Nov 27, 2001
National Instruments Corporation
Christopher G. Regier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
System and method for compensating the dielectric absorption of a c...
Patent number
6,294,945
Issue date
Sep 25, 2001
National Instruments Corporation
Christopher G. Regier
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrating analog to digital converter with improved resolution
Patent number
6,243,034
Issue date
Jun 5, 2001
National Instruments Corporation
Christopher G. Regier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Analog switch comprising connected bipolar junction transistors
Patent number
6,140,859
Issue date
Oct 31, 2000
National Instruments Corporation
Christopher G. Regier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Current mode track and hold circuit
Patent number
5,841,383
Issue date
Nov 24, 1998
National Instruments Corporation
Christopher G. Regier
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and apparatus for deglitching DAC signals
Patent number
5,646,620
Issue date
Jul 8, 1997
National Instruments Corporation
Christopher G. Regier
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
Self-Calibration of Source-Measure Unit via Capacitor
Publication number
20190146050
Publication date
May 16, 2019
National Instruments Corporation
Christopher G. Regier
G01 - MEASURING TESTING
Information
Patent Application
Digitally Compensating for the Impact of Input Bias Current on Curr...
Publication number
20170146575
Publication date
May 25, 2017
National Instruments Corporation
Pablo E. Limon-Garcia-Viesca
G01 - MEASURING TESTING
Information
Patent Application
Digital Approach to the Removal of AC Parasitics for Impedance Meas...
Publication number
20170139001
Publication date
May 18, 2017
National Instruments Corporation
Blake A. Lindell
G01 - MEASURING TESTING
Information
Patent Application
Single-Junction Voltage Reference
Publication number
20150286239
Publication date
Oct 8, 2015
National Instruments Corporation
Christopher G. Regier
G01 - MEASURING TESTING
Information
Patent Application
Efficient Low Noise High Speed Amplifier
Publication number
20150171793
Publication date
Jun 18, 2015
National Instruments Corporation
Christopher G. Regier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Self-Calibration of Source-Measure Unit via Capacitor
Publication number
20150168529
Publication date
Jun 18, 2015
National Instruments Corporation
Christopher G. Regier
G01 - MEASURING TESTING
Information
Patent Application
Compensation Methods for Digital Source-Measure-Units (SMUs)
Publication number
20120306517
Publication date
Dec 6, 2012
Christopher G. Regier
G01 - MEASURING TESTING
Information
Patent Application
Fast Current Saturation Recovery for a Digital Source Measure Unit...
Publication number
20120306518
Publication date
Dec 6, 2012
Christopher G. Regier
G01 - MEASURING TESTING
Information
Patent Application
Compliance Methods for Source Measure Units Operating with Digital...
Publication number
20120306559
Publication date
Dec 6, 2012
Christopher G. Regier
G01 - MEASURING TESTING
Information
Patent Application
Resistance Simulation and Common Mode Rejection for Digital Source-...
Publication number
20120306460
Publication date
Dec 6, 2012
Christopher G. Regier
G01 - MEASURING TESTING
Information
Patent Application
Source-Measure Unit Based on Digital Control Loop
Publication number
20090121908
Publication date
May 14, 2009
Christopher G. Regier
G01 - MEASURING TESTING
Information
Patent Application
AC Amplifier for Precision Measurement
Publication number
20080111560
Publication date
May 15, 2008
Christopher G. Regier
G01 - MEASURING TESTING
Information
Patent Application
Differential structure programmable gain instrumentation amplifier
Publication number
20060038615
Publication date
Feb 23, 2006
National Instruments Corporation
Christopher G. Regier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Programmable gain instrumentation amplifier with improved gain mult...
Publication number
20060038614
Publication date
Feb 23, 2006
National Instruments Corporation
Christopher G. Regier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Differential filter topology with dielectric absorption cancellatio...
Publication number
20060038611
Publication date
Feb 23, 2006
National Instruments Corporation
Christopher G. Regier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Calibrating analog-to-digital systems using a precision reference a...
Publication number
20050197796
Publication date
Sep 8, 2005
Clayton H. Daigle
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Programmable gain instrumentation amplifier including a composite a...
Publication number
20050195027
Publication date
Sep 8, 2005
Christopher G. Regier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Programmable gain instrumentation amplifier having improved dielect...
Publication number
20050088229
Publication date
Apr 28, 2005
National Instruments Corporation
Christopher G. Regier
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Fast and accurate AC RMS and DC measurement
Publication number
20040034512
Publication date
Feb 19, 2004
Bakul Damle
G01 - MEASURING TESTING
Information
Patent Application
High-speed high-resolution ADC for precision measurements
Publication number
20040034499
Publication date
Feb 19, 2004
Christopher G. Regier
H03 - BASIC ELECTRONIC CIRCUITRY