Christopher Gerth

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Devices and methods for dual excitation Raman spectroscopy
- Patent number 8,513,002
- Issue date Aug 20, 2013
- Intel Corporation
- Andrew Arthur Berlin
- G01 - MEASURING TESTING
Information Patent Grant
Stimulated and coherent anti-stokes raman spectroscopic methods for...
- Patent number 8,088,628
- Issue date Jan 3, 2012
- Intel Corporation
- Andrew Arthur Berlin
- G01 - MEASURING TESTING
Information Patent Grant
Devices and methods for dual excitation Raman spectroscopy
- Patent number 8,009,288
- Issue date Aug 30, 2011
- Intel Corporation
- Andrew Arthur Berlin
- G01 - MEASURING TESTING
Information Patent Grant
Detection of contaminants on low wavelength masks
- Patent number 6,611,327
- Issue date Aug 26, 2003
- Intel Corporation
- Arun Ramamoorthy
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICES AND METHODS FOR DUAL EXCITATION RAMAN SPECTROSCOPY
- Publication number 20120034686
- Publication date Feb 9, 2012
- Andrew Arthur BERLIN
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND METHODS FOR DUAL EXCITATION RAMAN SPECTROSCOPY
- Publication number 20110275144
- Publication date Nov 10, 2011
- Andrew Arthur BERLIN
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopic analysis system and method
- Publication number 20060183236
- Publication date Aug 17, 2006
- Intel Corporation
- Andrew Arthur Berlin
- G01 - MEASURING TESTING
Information Patent Application
Method and device for detecting small numbers of molecules using su...
- Publication number 20050110990
- Publication date May 26, 2005
- Tae-Woong Koo
- G01 - MEASURING TESTING
Information Patent Application
Method and device for detecting a small number of molecules using s...
- Publication number 20050084980
- Publication date Apr 21, 2005
- Intel Corporation
- Tae-Woong Koo
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopic analysis system and method
- Publication number 20040142484
- Publication date Jul 22, 2004
- Intel Corporation
- Andrew Arthur Berlin
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopic analysis system and method
- Publication number 20040063214
- Publication date Apr 1, 2004
- Andrew Arthur Berlin
- G01 - MEASURING TESTING
Information Patent Application
Detection of contaminants on low wavelength masks
- Publication number 20020135759
- Publication date Sep 26, 2002
- Arun Ramamoorthy
- G01 - MEASURING TESTING

Christopher Gerth

Person

Patents Grantslast 30 patents

Devices and methods for dual excitation Raman spectroscopy

Stimulated and coherent anti-stokes raman spectroscopic methods for...

Devices and methods for dual excitation Raman spectroscopy

Detection of contaminants on low wavelength masks

Patents Applicationslast 30 patents

DEVICES AND METHODS FOR DUAL EXCITATION RAMAN SPECTROSCOPY

DEVICES AND METHODS FOR DUAL EXCITATION RAMAN SPECTROSCOPY

Spectroscopic analysis system and method

Method and device for detecting small numbers of molecules using su...

Method and device for detecting a small number of molecules using s...

Spectroscopic analysis system and method

Spectroscopic analysis system and method

Detection of contaminants on low wavelength masks