Christopher Gould

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Glen Allen, VA, US

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Patents Grantslast 30 patents

Information Patent Grant
Targets for measurements in semiconductor devices
- Patent number 7,427,774
- Issue date Sep 23, 2008
- Infineon Technologies AG
- Ulrich Mantz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for automated beam optimization in a scanning...
- Patent number 7,358,493
- Issue date Apr 15, 2008
- Infineon Technologies Richmond, LP
- William Roberts
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lithography method and system with correction of overlay offset err...
- Patent number 7,184,853
- Issue date Feb 27, 2007
- Infineon Technologies Richmond, LP
- William Roberts
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method to predict the state of a process controller in a...
- Patent number 7,127,304
- Issue date Oct 24, 2006
- Infineon Technologies Richmond, LP
- Christopher Gould
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Enhanced overlay measurement marks for overlay alignment and exposu...
- Patent number 6,727,989
- Issue date Apr 27, 2004
- Infineon Technologies AG
- Xiaoming Yin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
System and method for controlling a semiconductor manufacturing pro...
- Publication number 20090215206
- Publication date Aug 27, 2009
- QIMONDA NORTH AMERICA CORP.
- Abeer Singhal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for consolidating process control
- Publication number 20080125883
- Publication date May 29, 2008
- Christopher Gould
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and apparatus for automated beam optimization in a scanning...
- Publication number 20060278826
- Publication date Dec 14, 2006
- William Roberts
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Lithography method and system with correction of overlay offset err...
- Publication number 20060265097
- Publication date Nov 23, 2006
- William Roberts
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System and method for real time prediction and/or inheritance of pr...
- Publication number 20060265098
- Publication date Nov 23, 2006
- Infineon Technologies Richmond, LP
- Christopher Gould
- G05 - CONTROLLING REGULATING
Information Patent Application
Automated focus feedback for optical lithography tool
- Publication number 20060192931
- Publication date Aug 31, 2006
- William Roberts
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY