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Christopher Hils
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Redmond, WA, US
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last 30 patents
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Patent Grant
Eddy current probe having diagonal magnetic fields alternating betw...
Patent number
6,734,668
Issue date
May 11, 2004
Zetec, Inc.
Christopher Hils
G01 - MEASURING TESTING
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Patent Grant
Discretized magnetic field in eddy current probe
Patent number
6,710,595
Issue date
Mar 23, 2004
Christopher Hils
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
EDDY CURRENT PROBE HAVING DIAGONAL MAGNETIC FIELDS ALTERNATING BETW...
Publication number
20040066191
Publication date
Apr 8, 2004
Christopher Hils
G01 - MEASURING TESTING
Information
Patent Application
DISCRETIZED MAGNETIC FIELD IN EDDY CURRENT PROBE
Publication number
20040041561
Publication date
Mar 4, 2004
Christopher Hils
G01 - MEASURING TESTING