Christopher J. Morath

Person

Basking Ridge, NJ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Micro-LED transfer methods using light-based debonding
- Patent number 10,985,046
- Issue date Apr 20, 2021
- Veeco Instruments Inc.
- Ajit P. Paranjpe
- B32 - LAYERED PRODUCTS
Information Patent Grant
Gas concentration sensors and systems
- Patent number 10,571,430
- Issue date Feb 25, 2020
- Veeco Instruments Inc.
- Chi-Jung Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced enclosures for acoustical gas concentration sensing and fl...
- Patent number 10,099,185
- Issue date Oct 16, 2018
- Veeco Instruments Inc.
- Ray Logue
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Substrate analysis using surface acoustic wave metrology
- Patent number 9,041,931
- Issue date May 26, 2015
- Rudolph Technologies, Inc.
- Michael Colgan
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Metrology system with spectroscopic ellipsometer and photoacoustic...
- Patent number 7,705,974
- Issue date Apr 27, 2010
- Rudolph Technologies, Inc.
- Robert Gregory Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Metrology system with spectroscopic ellipsometer and photoacoustic...
- Patent number 7,522,272
- Issue date Apr 21, 2009
- Rudolph Technologies, Inc.
- Robert Gregory Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Metrology system with spectroscopic ellipsometer and photoacoustic...
- Patent number 7,253,887
- Issue date Aug 7, 2007
- Rudolph Technologies, Inc.
- Robert Gregory Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for increasing signal to noise ratio in a phot...
- Patent number 7,050,178
- Issue date May 23, 2006
- Rudolph Technologies, Inc.
- Christopher Morath
- G01 - MEASURING TESTING
Information Patent Grant
Measuring elastic moduli of dielectric thin films using an optical...
- Patent number 7,019,845
- Issue date Mar 28, 2006
- Rudolph Technologies, Inc.
- Sean P. Leary
- G01 - MEASURING TESTING
Information Patent Grant
Metrology system with spectroscopic ellipsometer and photoacoustic...
- Patent number 7,006,221
- Issue date Feb 28, 2006
- Rudolph Technologies, Inc.
- Robert Gregory Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for decreasing thermal loading and roughness s...
- Patent number 6,504,618
- Issue date Jan 7, 2003
- Rudolph Technologies, Inc.
- Christopher Morath
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Micro-LED Transfer Methods Using Light-Based Debonding
- Publication number 20190393069
- Publication date Dec 26, 2019
- VEECO INSTRUMENTS INC.
- Ajit P. Paranjpe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS CONCENTRATION SENSORS AND SYSTEMS
- Publication number 20170261471
- Publication date Sep 14, 2017
- VEECO INSTRUMENTS INC.
- Chi-Jung Cheng
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED ENCLOSURES FOR ACOUSTICAL GAS CONCENTRATION SENSING AND FL...
- Publication number 20160041126
- Publication date Feb 11, 2016
- VEECO INSTRUMENTS, INC.
- Ray Logue
- G01 - MEASURING TESTING
Information Patent Application
Substrate Analysis Using Surface Acoustic Wave Metrology
- Publication number 20120309116
- Publication date Dec 6, 2012
- Michael Colgan
- B82 - NANO-TECHNOLOGY
Information Patent Application
Metrology system with spectroscopic ellipsometer and photoacoustic...
- Publication number 20090201502
- Publication date Aug 13, 2009
- Robert Gregory Wolf
- G01 - MEASURING TESTING
Information Patent Application
Metrology system with spectroscopic ellipsometer and photoacoustic...
- Publication number 20070268478
- Publication date Nov 22, 2007
- Rudolph Technologies, Inc.
- Robert Gregory Wolf
- G01 - MEASURING TESTING
Information Patent Application
Combined ultra-fast x-ray and optical system for thin film measurem...
- Publication number 20060256916
- Publication date Nov 16, 2006
- Rudolph Technologies, Inc.
- Michael Kotelyanskii
- G01 - MEASURING TESTING
Information Patent Application
Metrology system with spectroscopic ellipsometer and photoacoustic...
- Publication number 20060126057
- Publication date Jun 15, 2006
- Rudolph Technologies, Inc.
- Robert Gregory Wolf
- G01 - MEASURING TESTING
Information Patent Application
MEASURING ELASTIC MODULI OF DIELECTRIC THIN FILMS USING AN OPTICAL...
- Publication number 20060072120
- Publication date Apr 6, 2006
- Rudolph Technologies, Inc.
- Sean P. Leary
- G01 - MEASURING TESTING
Information Patent Application
Metrology system with spectroscopic ellipsometer and photoacoustic...
- Publication number 20030076497
- Publication date Apr 24, 2003
- Robert Gregory Wolf
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for increasing signal to noise ratio in a phot...
- Publication number 20030020929
- Publication date Jan 30, 2003
- Christopher Morath
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for decreasing thermal loading and roughness s...
- Publication number 20020135784
- Publication date Sep 26, 2002
- Rudolph Technologies, Inc.
- Christopher Morath
- G01 - MEASURING TESTING

Christopher J. Morath

Person

Patents Grantslast 30 patents

Micro-LED transfer methods using light-based debonding

Gas concentration sensors and systems

Enhanced enclosures for acoustical gas concentration sensing and fl...

Substrate analysis using surface acoustic wave metrology

Metrology system with spectroscopic ellipsometer and photoacoustic...

Metrology system with spectroscopic ellipsometer and photoacoustic...

Metrology system with spectroscopic ellipsometer and photoacoustic...

Method and apparatus for increasing signal to noise ratio in a phot...

Measuring elastic moduli of dielectric thin films using an optical...

Metrology system with spectroscopic ellipsometer and photoacoustic...

Method and apparatus for decreasing thermal loading and roughness s...

Patents Applicationslast 30 patents

Micro-LED Transfer Methods Using Light-Based Debonding

GAS CONCENTRATION SENSORS AND SYSTEMS

ENHANCED ENCLOSURES FOR ACOUSTICAL GAS CONCENTRATION SENSING AND FL...

Substrate Analysis Using Surface Acoustic Wave Metrology

Metrology system with spectroscopic ellipsometer and photoacoustic...

Metrology system with spectroscopic ellipsometer and photoacoustic...

Combined ultra-fast x-ray and optical system for thin film measurem...

Metrology system with spectroscopic ellipsometer and photoacoustic...

MEASURING ELASTIC MODULI OF DIELECTRIC THIN FILMS USING AN OPTICAL...

Metrology system with spectroscopic ellipsometer and photoacoustic...

Method and apparatus for increasing signal to noise ratio in a phot...

Method and apparatus for decreasing thermal loading and roughness s...