Christopher J. Stephens

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West Sussex, GB

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for electron backscatter diffraction sample c...
- Patent number 12,099,024
- Issue date Sep 24, 2024
- FEI Company
- Austin Penrose Day
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for acquiring electron backscatter diffraction...
- Patent number 11,114,275
- Issue date Sep 7, 2021
- FEI Company
- Pavel Stejskal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUS FOR ELECTRON BACKSCATTER DIFFRACTION SAMPLE C...
- Publication number 20220136985
- Publication date May 5, 2022
- VG SYSTEMS LIMITED
- Austin Penrose DAY
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR ACQUIRING ELECTRON BACKSCATTER DIFFRACTION...
- Publication number 20210005420
- Publication date Jan 7, 2021
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS